| Porous silicon formation by stain etching É Vázsonyi, E Szilágyi, P Petrik, ZE Horváth, T Lohner, M Fried, ... Thin Solid Films 388 (1-2), 295-302, 2001 | 128 | 2001 |
| Comparative study of surface roughness measured on polysilicon using spectroscopic ellipsometry and atomic force microscopy P Petrik, LP Biró, M Fried, T Lohner, R Berger, C Schneider, J Gyulai, ... Thin Solid Films 315 (1-2), 186-191, 1998 | 118 | 1998 |
| Characterization of different porous silicon structures by spectroscopic ellipsometry M Fried, T Lohner, O Polgar, P Petrik, E Vazsonyi, I Barsony, JP Piel, ... Thin Solid Films 276 (1-2), 223-227, 1996 | 72 | 1996 |
| Ellipsometric study of polycrystalline silicon films prepared by low-pressure chemical vapor deposition P Petrik, T Lohner, M Fried, LP Biró, NQ Khánh, J Gyulai, W Lehnert, ... Journal of Applied Physics 87 (4), 1734-1742, 2000 | 67 | 2000 |
| Reconstruction of sub-wavelength features and nano-positioning of gratings using coherent Fourier scatterometry N Kumar, P Petrik, GKP Ramanandan, O El Gawhary, S Roy, SF Pereira, ... Optics express 22 (20), 24678-24688, 2014 | 56 | 2014 |
| Structural characterization of AlN films synthesized by pulsed laser deposition A Szekeres, Z Fogarassy, P Petrik, E Vlaikova, A Cziraki, G Socol, ... Applied Surface Science 257 (12), 5370-5374, 2011 | 44 | 2011 |
| Ellipsometric characterization of damage profiles using an advanced optical model P Petrik, O Polgár, M Fried, T Lohner, NQ Khánh, J Gyulai Journal of Applied Physics 93 (4), 1987-1990, 2003 | 44 | 2003 |
| High-speed imaging/mapping spectroscopic ellipsometry for in-line analysis of roll-to-roll thin-film photovoltaics A Shan, M Fried, G Juhász, C Major, O Polgár, Á Németh, P Petrik, ... IEEE journal of Photovoltaics 4 (1), 355-361, 2013 | 42 | 2013 |
| Comparative study of polysilicon-on-oxide using spectroscopic ellipsometry, atomic force microscopy, and transmission electron microscopy P Petrik, M Fried, T Lohner, R Berger, LP Bı́ró, C Schneider, J Gyulai, ... Thin Solid Films 313, 259-263, 1998 | 42 | 1998 |
| The composition and structure of the ubiquitous hydrocarbon contamination on van der Waals materials A Pálinkás, G Kálvin, P Vancsó, K Kandrai, M Szendrő, G Németh, ... Nature Communications 13 (1), 6770, 2022 | 41 | 2022 |
| Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction M Serényi, T Lohner, P Petrik, Z Zolnai, ZE Horváth, NQ Khánh Thin Solid Films 516 (22), 8096-8100, 2008 | 39 | 2008 |
| High-quality PMMA/ZnO NWs piezoelectric coating on rigid and flexible metallic substrates M Chelu, H Stroescu, M Anastasescu, JM Calderon-Moreno, S Preda, ... Applied Surface Science 529, 147135, 2020 | 36 | 2020 |
| Oxidation of SiC investigated by ellipsometry and Rutherford backscattering spectrometry E Szilágyi, P Petrik, T Lohner, AA Koós, M Fried, G Battistig Journal of Applied Physics 104 (1), 2008 | 36 | 2008 |
| Nanocrystal characterization by ellipsometry in porous silicon using model dielectric function P Petrik, M Fried, E Vazsonyi, P Basa, T Lohner, P Kozma, Z Makkai Journal of Applied Physics 105 (2), 2009 | 35 | 2009 |
| Approaches to calculate the dielectric function of ZnO around the band gap E Agocs, B Fodor, B Pollakowski, B Beckhoff, A Nutsch, M Jank, P Petrik Thin Solid Films 571, 684-688, 2014 | 34 | 2014 |
| Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy M Serényi, T Lohner, P Petrik, C Frigeri Thin Solid Films 515 (7-8), 3559-3562, 2007 | 34 | 2007 |
| Sol–gel synthesis of nanostructured indium tin oxide with controlled morphology and porosity L Kőrösi, A Scarpellini, P Petrik, S Papp, I Dékány Applied surface science 320, 725-731, 2014 | 33 | 2014 |
| Refractive index depth profile in PMMA due to proton irradiation I Rajta, SZ Szilasi, J Budai, Z Tóth, P Petrik, E Baradács Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2007 | 33 | 2007 |
| Porosity and thickness characterization of porous Si and oxidized porous Si layers–An ultraviolet–visible–mid infrared ellipsometry study B Fodor, E Agocs, B Bardet, T Defforge, F Cayrel, D Alquier, M Fried, ... microporous and mesoporous materials 227, 112-120, 2016 | 31 | 2016 |
| Parameterization of the dielectric function of semiconductor nanocrystals P Petrik Physica B: Condensed Matter 453, 2-7, 2014 | 31 | 2014 |