Franz J. Giessibl

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(Jay) Alfred John WeymouthUniversität RegensburgVerified email at physik.uni-regensburg.de
Jochen MannhartVerified email at fkf.mpg.de
Bharat BhushanThe Ohio State University (San Jose, CA)Verified email at osu.edu
Roland WiesendangerProfessor for Physics, University of HamburgVerified email at physnet.uni-hamburg.de
Angelo PeronioFormer postdoc, AG Giessibl, Universität RegensburgVerified email at ur.de
Norio OkabayashiKanazawa UniversityVerified email at staff.kanazawa-u.ac.jp
Jascha ReppProfessor of Physics, Universität RegensburgVerified email at ur.de
Meyer ErnstUniversity of BaselVerified email at unibas.ch
Markus TernesPGI-3, Jülich Research Centre; RWTH University AachenVerified email at fz-juelich.de
Leo GrossIBM Research - ZurichVerified email at zurich.ibm.com
Andrei Cristian IonescuDepartment of Biomedical, Surgical and dental Sciences, University of MilanVerified email at unimi.it
Christopher P LutzStaff Scientist, IBM Research, Almaden Research CenterVerified email at us.ibm.com
Andreas HeinrichIBS Center for Quantum Nanoscience at Ewha Womans UniversityVerified email at qns.science
Sergiy MankovskyVerified email at cup.uni-muenchen.de
Magnus PaulssonLinnéuniversitetetVerified email at lnu.se
Pavel JelínekInstitute of Physics, Czech Academy of Sciences, Czech RepublicVerified email at fzu.cz
Toyoko AraiKanazawa UniversityVerified email at staff.kanazawa-u.ac.jp
Cyrus F. HirjibehedinMIT Lincoln LaboratoryVerified email at ll.mit.edu
Peter LiljerothAalto UniversityVerified email at aalto.fi
Prokop Hapalaczech academy of scienceVerified email at fzu.cz

Franz J. Giessibl

University of Regensburg, NIST, U Augsburg, McKinsey, Park Sci. Instrum., IBM Research, LMU, ETHZ

Verified email at ur.de

AFM qPlus STM Quantum Physics Materials Science


Title Sort by citations Sort by year Sort by title	Cited by Cited by	Year
Springer handbook of nanotechnology B Bhushan Springer, 2017	3987	2017
Advances in atomic force microscopy FJ Giessibl Reviews of modern physics 75 (3), 949, 2003	3220	2003
Atomic resolution of the silicon (111)-(7× 7) surface by atomic force microscopy FJ Giessibl Science 267 (5194), 68-71, 1995	1641	1995
Noncontact Atomic Force Microscopy: Volume 3 S Morita, FJ Giessibl, E Meyer, R Wiesendanger Springer, 2015	1121	2015
Forces and frequency shifts in atomic-resolution dynamic-force microscopy FJ Giessibl Physical Review B 56 (24), 16010, 1997	894	1997
High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork FJ Giessibl Applied physics letters 73 (26), 3956-3958, 1998	804	1998
Atomic resolution on by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork FJ Giessibl Applied Physics Letters 76 (11), 1470-1472, 2000	713	2000
The force needed to move an atom on a surface M Ternes, CP Lutz, CF Hirjibehedin, FJ Giessibl, AJ Heinrich Science 319 (5866), 1066-1069, 2008	547	2008
Subatomic features on the silicon (111)-(7× 7) surface observed by atomic force microscopy FJ Giessibl, S Hembacher, H Bielefeldt, J Mannhart Science 289 (5478), 422-425, 2000	535	2000
Measuring the charge state of an adatom with noncontact atomic force microscopy L Gross, F Mohn, P Liljeroth, J Repp, FJ Giessibl, G Meyer Science 324 (5933), 1428-1431, 2009	438	2009
A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy FJ Giessibl Applied Physics Letters 78 (1), 123-125, 2001	404	2001
Nanotribology and nanomechanics: an introduction B Bhushan Springer, 2008	335	2008
The qPlus sensor, a powerful core for the atomic force microscope FJ Giessibl Review of scientific instruments 90 (1), 2019	309	2019
Revealing the hidden atom in graphite by low-temperature atomic force microscopy S Hembacher, FJ Giessibl, J Mannhart, CF Quate Proceedings of the National Academy of Sciences 100 (22), 12539-12542, 2003	260	2003
Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy FJ Giessibl, H Bielefeldt, S Hembacher, J Mannhart Applied Surface Science 140 (3-4), 352-357, 1999	248	1999
Force microscopy with light-atom probes S Hembacher, FJ Giessibl, J Mannhart Science 305 (5682), 380-383, 2004	202	2004
AFM's path to atomic resolution FJ Giessibl Materials Today 8 (5), 32-41, 2005	198	2005
Physical interpretation of frequency-modulation atomic force microscopy FJ Giessibl, H Bielefeldt Physical Review B 61 (15), 9968, 2000	195	2000
Revealing the angular symmetry of chemical bonds by atomic force microscopy J Welker, FJ Giessibl Science 336 (6080), 444-449, 2012	170	2012
Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters M Emmrich, F Huber, F Pielmeier, J Welker, T Hofmann, ... Science 348 (6232), 308-311, 2015	168	2015

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