Follow
James Claverley
James Claverley
Higher Research Scientist, National Physical Laboratory
Verified email at npl.co.uk - Homepage
Title
Cited by
Cited by
Year
A vibrating micro-scale CMM probe for measuring high aspect ratio structures
JD Claverley, RK Leach
Microsystem Technologies 16, 1507-1512, 2010
1102010
Development of a three-dimensional vibrating tactile probe for miniature CMMs
JD Claverley, RK Leach
Precision Engineering 37 (2), 491-499, 2013
792013
A review of the existing performance verification infrastructure for micro-CMMs
JD Claverley
Precision Engineering, 168-175, 2014
752014
Practical estimation of measurement noise and flatness deviation on focus variation microscopes
CL Giusca, JD Claverley, W Sun, RK Leach, F Helmli, MPJ Chavigner
CIRP Annals 63 (1), 545-548, 2014
602014
Transient photocurrent and photovoltage mapping for characterisation of defects in organic photovoltaics
S Wood, D O'Connor, CW Jones, JD Claverley, JC Blakesley, C Giusca, ...
Solar Energy Materials and Solar Cells 161, 89-95, 2017
512017
Phase calibration target for quantitative phase imaging with ptychography
TM Godden, A Muñiz-Piniella, JD Claverley, A Yacoot, MJ Humphry
Optics express 24 (7), 7679-7692, 2016
372016
Advances in engineering nanometrology at the National Physical Laboratory
RK Leach, J Claverley, C Giusca, CW Jones, L Nimishakavi, W Sun, ...
Measurement Science and Technology 23 (7), 074002, 2012
372012
Modelling the interaction forces between an ideal measurement surface and the stylus tip of a novel vibrating micro-scale CMM probe
JD Claverley, A Georgi, RK Leach
Precision Assembly Technologies and Systems: 5th IFIP WG 5.5 International …, 2010
202010
Assembly of a novel MEMS-based 3D vibrating micro-scale co-ordinate measuring machine probe using desktop factory automation
JD Claverley, DY Sheu, A Burisch, RK Leach, A Raatz
2011 IEEE International Symposium on Assembly and Manufacturing (ISAM), 1-5, 2011
132011
Chapter 9—Coordinate Metrology
D Flack, J Claverley, R Leach
Fundamental Principles of Engineering Nanometrolog, 2nd ed.; Leach, R., Ed …, 2014
82014
Numerical modelling methodology for design of miniaturised integrated products-an application to 3D CMM micro-probe development
P Rajaguru, S Stoyanov, YK Tang, C Bailey, J Claverley, R Leach, ...
2010 11th International Thermal, Mechanical & Multi-Physics Simulation, and …, 2010
72010
Quality control for deep x-ray lithography (LIGA): a preliminary metrology study
P Meyer, JD Claverley, RK Leach
Microsystem Technologies 18, 415-421, 2012
62012
Semi-automated assembly of a MEMS-based micro-scale CMM probe and future optimization of the process chain with a view to desktop factory automation
JD Claverley, A Burisch, RK Leach, A Raatz
Precision Assembly Technologies and Systems: 6th IFIP WG 5.5 International …, 2012
62012
Assembly of the stem and tip of an innovative micro-CMM probe
D Smale, S Ratchev, J Segal, RK Leach, JD Claverley
Proc. Lamdamap, 442-451, 2009
62009
Verification of an optical micro-CMM using the focus variation technique: Aspects of probing errors
W Sun, JD Claverley
CIRP Annals 64 (1), 511-514, 2015
52015
Utilisation of FIB/SEM technology in the assembly of an innovative micro-CMM probe
D Smale, S Haley, J Segal, R Ronaldo, S Ratchev, RK Leach, ...
Precision Assembly Technologies and Systems: 5th IFIP WG 5.5 International …, 2010
52010
Three-dimensional characterisation of a novel vibrating tactile probe for miniature CMMs
J Claverley, R Leach
Laser Metrology and Machine Performance X (LAMDAMAP), Chicheley, UK, 257-265, 2013
42013
Reduced order modelling for risk mitigation in design of miniaturised/integrated products
S Stoyanov, P Rajaguru, YK Tang, C Bailey, J Claverley, R Leach
33rd International Spring Seminar on Electronics Technology, ISSE 2010, 402-407, 2010
42010
Development and validation of a 3D vibrating contact probe for micro-CMMs
JD Claverley
University of Nottingham, 2014
32014
A novel three-axis vibrating micro-CMM probe with isotropic probing forces
JD Claverley, RK Leach
Microsystem Technologies 16 (8–9), 1507-1512, 2010
32010
The system can't perform the operation now. Try again later.
Articles 1–20