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Co-authors
- Fan RenUniversity of Florida, Bell Lab, AT&TVerified email at che.ufl.edu
- Stephen PeartonProfessor of Materials Science and Engineering, University of FloridaVerified email at mse.ufl.edu
- Cammy R AbernathyUniversity of FloridaVerified email at eng.ufl.edu
- Jihyun KimSeoul National UniversityVerified email at snu.ac.kr
- Wayne JohnsonSoundside Partners LLCVerified email at soundsidepartners.com
- Soohwan JangDankook UniversityVerified email at dankook.ac.kr
- Robert C. Fitch, Jr.Principal Electronics Engineer, AFRLVerified email at us.af.mil
- Erica DouglasSandia National LaboratoriesVerified email at sandia.gov
- James K GillespieSenior Electronics Engineer AFRLVerified email at us.af.mil
- Travis J. AndersonUniversity of FloridaVerified email at che.ufl.edu
- Jenshan LinUniversity of FloridaVerified email at ieee.org
- Lu LiuUniversity of Florida, Stanford UniversityVerified email at stanford.edu
- Arthur HebardProfessor of PhysicsVerified email at phys.ufl.edu
- Maxime G. LemaitreB.S., University of Illinois; M.S. and Ph.D., University of Florida; Mattrix TechnologiesVerified email at ufl.edu
- Edwin PinerProfessor, Texas State UniversityVerified email at txstate.edu
- Seth Ariel (Sefaattin) TongayArizona State UniversityVerified email at asu.edu
- Wantae LimSamsung ElectronicsVerified email at samsung.com
- Lars VossLawrence Livermore National LaboratoryVerified email at llnl.gov
- Ivan KravchenkoORNLVerified email at ornl.gov
- Valentin CraciunNatl. Inst. for Laser, Plasma and Radiation PhysicsVerified email at inflpr.ro