Articles with public access mandates - Aparna AdhikariLearn more
Not available anywhere: 1
Analysis, Estimation and Impact of Joule Heating in the Electromigration Test of Copper ULSI Interconnects
A Adhikari, A Roy
2019 International Conference on Ubiquitous and Emerging Concepts on Sensors …, 2019
Mandates: Department of Science & Technology, India
Available somewhere: 4
Experimenting and modeling of catastrophic failure in electromigration-induced resistance degradation for deep submicron dual-damascene copper interconnects
A Adhikari, A Roy
Solid-State Electronics 148, 7-15, 2018
Mandates: Department of Science & Technology, India
Theory and experiment on charging and discharging a capacitor through a reverse-biased diode
A Roy, A Mallick, A Adhikari, P Guin, D Chatterjee
American Journal of Physics 86 (6), 417-421, 2018
Mandates: Department of Science & Technology, India
Microstructure measurement techniques for studying electromigration in ULSI interconnects
A Roy, A Adhikari
Critical Reviews in Solid State and Materials Sciences 41 (3), 159-191, 2016
Mandates: Department of Science & Technology, India
Inadequacy of Markov model in modeling of electromigration-induced resistance degradation
A Adhikari, A Roy
2018 IEEE Electron Devices Kolkata Conference (EDKCON), 142-147, 2018
Mandates: Department of Science & Technology, India
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