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Co-authors
- Akira FujiwaraNTTVerified email at lab.ntt.co.jp
- Shunri OdaTokyo Institute of TechnologyVerified email at pe.titech.ac.jp
- Masaya KataokaNational Physical LaboratoryVerified email at npl.co.uk
- Katsuhiko NishiguchiNTT Basic Research LaboratoriesVerified email at ntt.com
- Ken UchidaThe University of TokyoVerified email at material.t.u-tokyo.ac.jp
- Tetsuo KoderaTokyo Institute of TechnologyVerified email at m.titech.ac.jp
- Nathan JohnsonUniversity College LondonVerified email at ucl.ac.uk
- Yoshishige TsuchiyaLecturer, University of SouthamptonVerified email at ecs.soton.ac.uk
- Charles M. MarcusMaterials Science and Engineering and Department of Physics, University of WashingtonVerified email at uw.edu
- sungguen ryuAssistant profesor, UIB-IFISCVerified email at ifisc.uib-csic.es
- Hugh ChurchillProfessor of Physics, University of ArkansasVerified email at uark.edu
- Nobu-Hisa KanekoPrime Senior Researcher, NMIJ/AISTVerified email at aist.go.jp
- Kensaku ChidaNTT Basic Research Laboratories, NTTVerified email at ntt.com
- Zahid DurraniDept. of Electrical and Electronic Engineering, Imperial College LondonVerified email at imperial.ac.uk
- Shintaro TakadaQuantum Electrical Standards Group, NMIJ, AIST, JapanVerified email at aist.go.jp
- Tsunaki TakahashiDepartment of Applied Chemistry, The University of TokyoVerified email at g.ecc.u-tokyo.ac.jp
- Dong-Hun ChaePrincipal Research Scientist, Korea Research Institute of Standards and ScienceVerified email at kriss.re.kr