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Hoon SongSamsung Advanced Institute of TechnologyVerified email at samsung.com
Jungkwuen AnSamsung ResearchVerified email at samsung.com
Chil-Sung ChoiSamsung Advanced Institute of TechnologyVerified email at samsung.com
Kim Sun IlSamsung Advanced Institute of TechnologyVerified email at samsung.com
Byoungho LeeSeoul National University, Professor of School of Electrical and Computer EngineeringVerified email at snu.ac.kr
Chang-Kun LEESeoul National UniversityVerified email at snu.ac.kr
Kanghee WonKyung Hee UniversityVerified email at khu.ac.kr
Wontaek SeoSAITVerified email at samsung.com
Bongsu ShinSamsung ElectronicsVerified email at samsung.com
Yunhee KimSamsung electronicsVerified email at samsung.com
Alexander V MorozovSamsung R&D Intitute RusVerified email at rosatom.ru
Seokil MoonSeoul National University, Samsung ElectronicsVerified email at samsung.com
Jong-Young HongApple Inc.Verified email at apple.com
Sungwoo HwangSamsung Advanced Institute of TechnologyVerified email at samsung.com
YUN-TAE KIMPrincipal Researcher, SAIT, Samsung ElectronicsVerified email at samsung.com
Sergey E DubyninФизический институт имени П. Н. Лебедева Российской академии наукVerified email at lebedev.ru
Moon Gyu HanPrincipal Research Scientist, Samsung Advanced Institute of Technology, Samsung ElectronicsVerified email at samsung.com
Seok Ho SongHanyang UniversityVerified email at hanyang.ac.kr
Jun-Bo YoonDepartment of Electrical Engineering, KAISTVerified email at ee.kaist.ac.kr
Kyuhwan ChoiPrincipal Researcher, Samsung Advanced Institute of TechnologyVerified email at samsung.com
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Hong-Seok Lee
Associate Professor of Electrical Engineering, Pukyong National University
Verified email at pknu.ac.kr