| Step-by-step route for the synthesis of metal− organic frameworks O Shekhah, H Wang, S Kowarik, F Schreiber, M Paulus, M Tolan, ... Journal of the American Chemical Society 129 (49), 15118-15119, 2007 | 1008 | 2007 |
| X-ray scattering from soft-matter thin films: materials science and basic research M Tolan, M Tolan Springer 148, 148, 1999 | 981 | 1999 |
| Capillary waves at the transition from propagating to overdamped behavior A Madsen, T Seydel, M Sprung, C Gutt, M Tolan, G Grübel Physical review letters 92 (9), 096104, 2004 | 198 | 2004 |
| Microscopic structure of water at elevated pressures and temperatures CJ Sahle, C Sternemann, C Schmidt, S Lehtola, S Jahn, L Simonelli, ... Proceedings of the National Academy of Sciences 110 (16), 6301-6306, 2013 | 180 | 2013 |
| X-ray diffraction from Si/Ge layers: Diffuse scattering in the region of total external reflection JP Schlomka, M Tolan, L Schwalowsky, OH Seeck, J Stettner, W Press Physical review B 51 (4), 2311, 1995 | 175 | 1995 |
| Effect of osmolytes on pressure‐induced unfolding of proteins: a high‐pressure SAXS Study C Krywka, C Sternemann, M Paulus, M Tolan, C Royer, R Winter ChemPhysChem 9 (18), 2809-2815, 2008 | 152 | 2008 |
| Effects of partial coherence on the scattering of x rays by matter SK Sinha, M Tolan, A Gibaud Physical Review B 57 (5), 2740, 1998 | 151 | 1998 |
| Intercalation in layered metal–organic frameworks: reversible inclusion of an extended π-system HK Arslan, O Shekhah, DCF Wieland, M Paulus, C Sternemann, ... Journal of the American Chemical Society 133 (21), 8158-8161, 2011 | 146 | 2011 |
| Elucidating the mechanism of lipid membrane-induced IAPP fibrillogenesis and its inhibition by the red wine compound resveratrol: a synchrotron X-ray reflectivity study F Evers, C Jeworrek, S Tiemeyer, K Weise, D Sellin, M Paulus, B Struth, ... Journal of the American Chemical Society 131 (27), 9516-9521, 2009 | 132 | 2009 |
| Surfaces of strongly confined polymer thin films studied by X-ray scattering J Wang, M Tolan, OH Seeck, SK Sinha, O Bahr, MH Rafailovich, ... Physical review letters 83 (3), 564, 1999 | 124 | 1999 |
| Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method OH Seeck, ID Kaendler, M Tolan, K Shin, MH Rafailovich, J Sokolov, ... Applied Physics Letters 76 (19), 2713-2715, 2000 | 109 | 2000 |
| The new diffractometer for surface X-ray diffraction at beamline BL9 of DELTA C Krywka, M Paulus, C Sternemann, M Volmer, A Remhof, G Nowak, ... Journal of synchrotron radiation 13 (1), 8-13, 2006 | 104 | 2006 |
| Capillary waves in slow motion T Seydel, A Madsen, M Tolan, G Grübel, W Press Physical Review B 63 (7), 073409, 2001 | 104 | 2001 |
| Observation of Heterodyne Mixing in Surface X-Ray Photon Correlation<? format?> Spectroscopy Experiments C Gutt, T Ghaderi, V Chamard, A Madsen, T Seydel, M Tolan, M Sprung, ... Physical review letters 91 (7), 076104, 2003 | 97 | 2003 |
| The small-angle and wide-angle X-ray scattering set-up at beamline BL9 of DELTA C Krywka, C Sternemann, M Paulus, N Javid, R Winter, A Al-Sawalmih, ... Journal of synchrotron radiation 14 (3), 244-251, 2007 | 95 | 2007 |
| Exploring the piezophilic behavior of natural cosolvent mixtures MA Schroer, Y Zhai, DCF Wieland, CJ Sahle, J Nase, M Paulus, M Tolan, ... Angewandte Chemie 48 (123), 11615-11618, 2011 | 94 | 2011 |
| X-ray reflectivity of diblock copolymer monolayers at the air/water interface Z Li, W Zhao, J Quinn, MH Rafailovich, J Sokolov, RB Lennox, ... Langmuir 11 (12), 4785-4792, 1995 | 91 | 1995 |
| Cross‐amyloid interaction of Aβ and IAPP at lipid membranes J Seeliger, F Evers, C Jeworrek, S Kapoor, K Weise, E Andreetto, M Tolan, ... Angewandte Chemie International Edition 51 (3), 679-683, 2012 | 88 | 2012 |
| Observation of capillary waves on liquid thin films from mesoscopic to atomic length scales AK Doerr, M Tolan, W Prange, JP Schlomka, T Seydel, W Press, ... Physical review letters 83 (17), 3470, 1999 | 86 | 1999 |
| Carbon reactivity of binder metals in diamond–metal composites–characterization by scanning electron microscopy and X-ray diffraction W Tillmann, M Ferreira, A Steffen, K Rüster, J Möller, S Bieder, M Paulus, ... Diamond and related materials 38, 118-123, 2013 | 85 | 2013 |
