| Size effects of nanoindentation creep H Li, AHW Ngan Journal of materials research 19 (2), 513-522, 2004 | 261 | 2004 |
| Determining the elastic modulus and hardness of an ultra-thin film on a substrate using nanoindentation H Li, JJ Vlassak Journal of Materials Research 24 (3), 1114-1126, 2009 | 212 | 2009 |
| Investigation and Review of the Thermal, Mechanical, Electrical, Optical, and Structural Properties of Atomic Layer Deposited High-k Dielectrics: Beryllium Oxide, Aluminum … JT Gaskins, PE Hopkins, DR Merrill, SR Bauers, E Hadland, DC Johnson, ... ECS Journal of Solid State Science and Technology 6 (10), N189-N208, 2017 | 118 | 2017 |
| Stiffening of organosilicate glasses by organic cross-linking H Li, JM Knaup, E Kaxiras, JJ Vlassak Acta Materialia 59 (1), 44-52, 2011 | 85 | 2011 |
| The influence of hydrogen on the chemical, mechanical, optical/electronic, and electrical transport properties of amorphous hydrogenated boron carbide BJ Nordell, S Karki, TD Nguyen, P Rulis, AN Caruso, SS Purohit, H Li, ... Journal of Applied Physics 118 (3), 035703, 2015 | 53 | 2015 |
| The effect of porogen loading on the stiffness and fracture energy of brittle organosilicates H Li, Y Lin, TY Tsui, JJ Vlassak Journal of Materials Research 24 (1), 107-116, 2009 | 48 | 2009 |
| Indentation size effects on the strain rate sensitivity of nanocrystalline Ni–25at.% Al thin films H Li, AHW Ngan Scripta materialia 52 (9), 827-831, 2005 | 43 | 2005 |
| Continuous strain bursts in crystalline and amorphous metals during plastic deformation by nanoindentation H Li, AHW Ngan, MG Wang Journal of materials research 20 (11), 3072-3081, 2005 | 42 | 2005 |
| Water diffusion and fracture behavior in nanoporous low- dielectric film stacks H Li, TY Tsui, JJ Vlassak Journal of Applied Physics 106 (3), 033503, 2009 | 41 | 2009 |
| Investigation of atomic layer deposited beryllium oxide material properties for high-k dielectric applications D Koh, JH Yum, SK Banerjee, TW Hudnall, C Bielawski, WA Lanford, ... Journal of Vacuum Science & Technology B, Nanotechnology and …, 2014 | 31 | 2014 |
| New methods of analyzing indentation experiments on very thin films H Li, NX Randall, JJ Vlassak Journal of Materials Research 25 (4), 728-734, 2010 | 26 | 2010 |
| Atomic layer deposited lithium aluminum oxide:(In) dependency of film properties from pulsing sequence V Miikkulainen, O Nilsen, H Li, SW King, M Laitinen, T Sajavaara, ... Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 33 (1 …, 2015 | 24 | 2015 |
| Influence of hydrogen content and network connectivity on the coefficient of thermal expansion and thermal stability for a-SiC: H thin films SW King, L Ross, H Li, G Xu, J Bielefeld, RE Atkins, PD Henneghan, ... Journal of Non-Crystalline Solids 389, 78-85, 2014 | 20 | 2014 |
| Method to measure the elastic modulus and hardness of thin film on substrate by nanoindentation H Li, J Vlassak US Patent 8,265,884, 2012 | 15 | 2012 |
| Method to measure the elastic modulus and hardness of thin film on substrate by nanoindentation H Li, J Vlassak US Patent 8,265,884, 2012 | 15 | 2012 |
| Thermal Conductivity Enhancement in Ion-Irradiated Hydrogenated Amorphous Carbon Films EA Scott, SW King, NN Jarenwattananon, WA Lanford, H Li, J Rhodes, ... Nano Letters, 2021 | 13 | 2021 |
| Influence of CH 2 content and network defects on the elastic properties of organosilicate glasses JM Knaup, H Li, JJ Vlassak, E Kaxiras Physical Review B 83 (5), 054204, 2011 | 12 | 2011 |
| Quantitative interfacial energy measurements of adhesion-promoted thin copper films by supercritical fluid deposition on barrier layers CF Karanikas, H Li, JJ Vlassak, JJ Watkins Journal of Engineering Materials and Technology 132 (2), 021014, 2010 | 12 | 2010 |
| Controlled fracture of Cu/ultralow-k interconnects H Li, MJ Kobrinsky, A Shariq, J Richards, J Liu, M Kuhn Applied Physics Letters 103 (23), 231901, 2013 | 11 | 2013 |
| Poisson’s ratio and residual strain of freestanding ultra-thin films GK Cuddalorepatta, WM van Rees, L Han, D Pantuso, L Mahadevan, ... Journal of the Mechanics and Physics of Solids 137, 103821, 2020 | 10 | 2020 |
Joost VlassakHarvard UniversityVerified email at esag.harvard.edu
