| Leakage current: Moore's law meets static power NS Kim, T Austin, D Baauw, T Mudge, K Flautner, JS Hu, MJ Irwin, ... computer 36 (12), 68-75, 2003 | 1801 | 2003 |
| Razor: A low-power pipeline based on circuit-level timing speculation D Ernst, NS Kim, S Das, S Pant, R Rao, T Pham, C Ziesler, D Blaauw, ... Proceedings. 36th Annual IEEE/ACM International Symposium on …, 2003 | 1794 | 2003 |
| Drowsy caches: simple techniques for reducing leakage power K Flautner, NS Kim, S Martin, D Blaauw, T Mudge ACM SIGARCH Computer architecture news 30 (2), 148-157, 2002 | 1236 | 2002 |
| Near-threshold computing: Reclaiming moore's law through energy efficient integrated circuits RG Dreslinski, M Wieckowski, D Blaauw, D Sylvester, T Mudge Proceedings of the IEEE 98 (2), 253-266, 2010 | 1153 | 2010 |
| RazorII: In situ error detection and correction for PVT and SER tolerance S Das, C Tokunaga, S Pant, WH Ma, S Kalaiselvan, K Lai, DM Bull, ... IEEE Journal of Solid-State Circuits 44 (1), 32-48, 2008 | 764 | 2008 |
| Combined dynamic voltage scaling and adaptive body biasing for lower power microprocessors under dynamic workloads SM Martin, K Flautner, T Mudge, D Blaauw Proceedings of the 2002 IEEE/ACM international conference on Computer-aided …, 2002 | 681 | 2002 |
| Statistical timing analysis for intra-die process variations with spatial correlations A Agarwal, D Blaauw, V Zolotov ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No …, 2003 | 628 | 2003 |
| A self-tuning DVS processor using delay-error detection and correction S Das, D Roberts, S Lee, S Pant, D Blaauw, T Austin, K Flautner, T Mudge IEEE Journal of Solid-State Circuits 41 (4), 792-804, 2006 | 588 | 2006 |
| Theoretical and practical limits of dynamic voltage scaling B Zhai, D Blaauw, D Sylvester, K Flautner Proceedings of the 41st annual Design Automation Conference, 868-873, 2004 | 559 | 2004 |
| Razor: circuit-level correction of timing errors for low-power operation D Ernst, S Das, S Lee, D Blaauw, T Austin, T Mudge, NS Kim, K Flautner IEEE Micro 24 (6), 10-20, 2004 | 553 | 2004 |
| Statistical timing analysis: From basic principles to state of the art D Blaauw, K Chopra, A Srivastava, L Scheffer IEEE transactions on computer-aided design of integrated circuits and …, 2008 | 507 | 2008 |
| Hierarchical analysis of power distribution networks M Zhao, RV Panda, SS Sapatnekar, T Edwards, R Chaudhry, D Blaauw Proceedings of the 37th Annual Design Automation Conference, 150-155, 2000 | 466 | 2000 |
| A portable 2-transistor picowatt temperature-compensated voltage reference operating at 0.5 V M Seok, G Kim, D Blaauw, D Sylvester IEEE Journal of Solid-State Circuits 47 (10), 2534-2545, 2012 | 462 | 2012 |
| Neural cache: Bit-serial in-cache acceleration of deep neural networks C Eckert, X Wang, J Wang, A Subramaniyan, R Iyer, D Sylvester, ... 2018 ACM/IEEE 45Th annual international symposium on computer architecture …, 2018 | 456 | 2018 |
| Compute caches S Aga, S Jeloka, A Subramaniyan, S Narayanasamy, D Blaauw, R Das 2017 IEEE International Symposium on High Performance Computer Architecture …, 2017 | 393 | 2017 |
| Statistical analysis and optimization for VLSI: Timing and power A Srivastava, D Sylvester, D Blaauw Springer Science & Business Media, 2006 | 387 | 2006 |
| A 28 nm configurable memory (TCAM/BCAM/SRAM) using push-rule 6T bit cell enabling logic-in-memory S Jeloka, NB Akesh, D Sylvester, D Blaauw IEEE Journal of Solid-State Circuits 51 (4), 1009-1021, 2016 | 351 | 2016 |
| Analysis and mitigation of variability in subthreshold design B Zhai, S Hanson, D Blaauw, D Sylvester Proceedings of the 2005 international symposium on Low power electronics and …, 2005 | 335 | 2005 |
| A highly resilient routing algorithm for fault-tolerant NoCs D Fick, A DeOrio, G Chen, V Bertacco, D Sylvester, D Blaauw 2009 Design, Automation & Test in Europe Conference & Exhibition, 21-26, 2009 | 332 | 2009 |
| Ultralow-voltage, minimum-energy CMOS S Hanson, B Zhai, K Bernstein, D Blaauw, A Bryant, L Chang, KK Das, ... IBM journal of research and development 50 (4.5), 469-490, 2006 | 307 | 2006 |
