| Dynamics of solid thin-film dewetting in the silicon-on-insulator system E Bussmann, F Cheynis, F Leroy, P Müller, O Pierre-Louis New Journal of Physics 13 (4), 043017, 2011 | 83 | 2011 |
| Dewetting dynamics of silicon-on-insulator thin films F Cheynis, E Bussmann, F Leroy, T Passanante, P Müller Physical Review B—Condensed Matter and Materials Physics 84 (24), 245439, 2011 | 73 | 2011 |
| Sub-10 nm lateral spatial resolution in scanning capacitance microscopy achieved with solid platinum probes E Bussmann, CC Williams Review of scientific instruments 75 (2), 422-425, 2004 | 50 | 2004 |
| Single-electron tunneling force spectroscopy of an individual electronic state in a nonconducting surface E Bussmann, CC Williams Applied physics letters 88 (26), 2006 | 44 | 2006 |
| Atomic precision advanced manufacturing for digital electronics DR Ward, SW Schmucker, EM Anderson, E Bussmann, L Tracy, TM Lu, ... EDFA Technical Articles 22 (1), 4-10, 2020 | 41 | 2020 |
| Single-electron tunneling to insulator surfaces measured by frequency detection electrostatic force microscopy E Bussmann, DJ Kim, CC Williams Applied physics letters 85 (13), 2538-2540, 2004 | 35 | 2004 |
| All-optical lithography process for contacting nanometer precision donor devices DR Ward, MT Marshall, DM Campbell, TM Lu, JC Koepke, ... Applied Physics Letters 111 (19), 2017 | 30 | 2017 |
| Atomic-precision advanced manufacturing for Si quantum computing E Bussmann, RE Butera, JHG Owen, JN Randall, SM Rinaldi, ... MRS Bulletin 46, 607-615, 2021 | 29 | 2021 |
| Scanning capacitance microscopy registration of buried atomic-precision donor devices E Bussmann, M Rudolph, GS Subramania, S Misra, SM Carr, E Langlois, ... Nanotechnology 26 (8), 085701, 2015 | 27 | 2015 |
| Method for making semi-conductor nanocrystals oriented along a predefined direction L Borowik, JC Barbe, E Bussmann, F Cheynis, F LeRoy, D Mariolle, ... US Patent 8,697,548, 2014 | 23 | 2014 |
| Method for making semi-conductor nanocrystals L Borowik, JC Barbe, E Bussmann, F Cheynis, F Leroy, D Mariolle, ... US Patent 8,647,957, 2014 | 23 | 2014 |
| Stress effects on solid–state dewetting of nano–thin films F Cheynis, E Bussmann, F Leroy, T Passanante, P Müller International journal of nanotechnology 9 (3-7), 396-411, 2012 | 23 | 2012 |
| Thermal instability of silicon-on-insulator thin films measured by low-energy electron microscopy E Bussmann, F Cheynis, F Leroy, P Müller IOP Conference Series: Materials Science and Engineering 12 (1), 012016, 2010 | 23 | 2010 |
| One-Dimensional Defect-Mediated Diffusion of Si Adatoms <?format ?>on the Surface E Bussmann, S Bockenhauer, FJ Himpsel, BS Swartzentruber Physical Review Letters 101 (26), 266101, 2008 | 23 | 2008 |
| Single-electron manipulation to and from a SiO2 surface by electrostatic force microscopy E Bussmann, N Zheng, CC Williams Applied Physics Letters 86 (16), 2005 | 22 | 2005 |
| Impact of incorporation kinetics on device fabrication with atomic precision JA Ivie, Q Campbell, JC Koepke, MI Brickson, PA Schultz, RP Muller, ... Physical Review Applied 16 (5), 054037, 2021 | 19* | 2021 |
| Fabrication and field emission properties of vertical, tapered GaN nanowires etched via phosphoric acid BA Kazanowska, KR Sapkota, P Lu, AA Talin, E Bussmann, T Ohta, ... Nanotechnology 33 (3), 035301, 2021 | 18 | 2021 |
| AlCl3-Dosed Si(100)-2 × 1: Adsorbates, Chlorinated Al Chains, and Incorporated Al MS Radue, S Baek, A Farzaneh, KJ Dwyer, Q Campbell, AD Baczewski, ... The Journal of Physical Chemistry C 125 (21), 11336-11347, 2021 | 18 | 2021 |
| Semiconductor adiabatic qubits MS Carroll, W Witzel, NT Jacobson, A Ganti, AJ Landahl, M Lilly, ... US Patent 9,530,873, 2016 | 18 | 2016 |
| Catalytically enhanced thermal decomposition of chemically grown silicon oxide layers on Si (001) F Leroy, T Passanante, F Cheynis, S Curiotto, EB Bussmann, P Müller Applied Physics Letters 108 (11), 2016 | 18 | 2016 |
Shashank MisraSandia National LaboratoriesVerified email at sandia.gov