| Porous silicon formation by stain etching É Vázsonyi, E Szilágyi, P Petrik, ZE Horváth, T Lohner, M Fried, ... Thin Solid Films 388 (1-2), 295-302, 2001 | 130 | 2001 |
| Determination of complex dielectric functions of ion implanted and implanted‐annealed amorphous silicon by spectroscopic ellipsometry M Fried, T Lohner, WAM Aarnink, LJ Hanekamp, A Van Silfhout Journal of Applied Physics 71 (10), 5260-5262, 1992 | 124 | 1992 |
| Comparative study of surface roughness measured on polysilicon using spectroscopic ellipsometry and atomic force microscopy P Petrik, LP Biró, M Fried, T Lohner, R Berger, C Schneider, J Gyulai, ... Thin Solid Films 315 (1-2), 186-191, 1998 | 118 | 1998 |
| Nondestructive determination of damage depth profiles in ion‐implanted semiconductors by spectroscopic ellipsometry using different optical models M Fried, T Lohner, WAM Aarnink, LJ Hanekamp, A Van Silfhout Journal of applied physics 71 (6), 2835-2843, 1992 | 97 | 1992 |
| Efficiency improvement by porous silicon coating of multicrystalline solar cells A Krotkus, K Grigoras, V Pačebutas, I Barsony, E Vazsonyi, M Fried, ... Solar Energy Materials and Solar Cells 45 (3), 267-273, 1997 | 91 | 1997 |
| Ion beam irradiated channel waveguides in Er3+-doped tellurite glass S Berneschi, G Nunzi Conti, I Bányász, A Watterich, NQ Khanh, M Fried, ... Applied physics letters 90 (12), 2007 | 81 | 2007 |
| Characterization of different porous silicon structures by spectroscopic ellipsometry M Fried, T Lohner, O Polgár, P Petrik, E Vazsonyi, I Barsony, JP Piel, ... Thin Solid Films 276 (1-2), 223-227, 1996 | 74 | 1996 |
| Ellipsometric study of polycrystalline silicon films prepared by low-pressure chemical vapor deposition P Petrik, T Lohner, M Fried, LP Biró, NQ Khánh, J Gyulai, W Lehnert, ... Journal of Applied Physics 87 (4), 1734-1742, 2000 | 66 | 2000 |
| Ellipsometry of Silica nanoparticulate Langmuir− Blodgett films for the verification of the validity of effective medium approximations N Nagy, A Deák, Z Hórvölgyi, M Fried, A Agod, I Bársony Langmuir 22 (20), 8416-8423, 2006 | 61 | 2006 |
| Leaky mode suppression in planar optical waveguides written in Er: TeO2–WO3 glass and CaF2 crystal via double energy implantation with MeV N+ ions I Bányász, Z Zolnai, M Fried, S Berneschi, S Pelli, G Nunzi-Conti Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014 | 50 | 2014 |
| Comparison of algorithms used for evaluation of ellipsometric measurements random search, genetic algorithms, simulated annealing and hill climbing graph-searches O Polgár, M Fried, T Lohner, I Bársony Surface Science 457 (1-2), 157-177, 2000 | 49 | 2000 |
| Optical and electrical characterization of aluminium doped ZnO layers C Major, A Nemeth, G Radnoczi, Z Czigany, M Fried, Z Labadi, I Barsony Applied Surface Science 255 (21), 8907-8912, 2009 | 47 | 2009 |
| Ion-implantation induced anomalous surface amorphization in silicon T Lohner, E Kotai, NQ Khanh, Z Toth, M Fried, K Vedam, NV Nguyen, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1994 | 46 | 1994 |
| Ellipsometric characterization of damage profiles using an advanced optical model P Petrik, O Polgár, M Fried, T Lohner, NQ Khánh, J Gyulai Journal of Applied Physics 93 (4), 1987-1990, 2003 | 44 | 2003 |
| Comparative study on Fe32Ni36Cr14P12B6 metallic glass and its polycrystalline modification bombarded by 2000 keV helium ions with high fluence A Manuaba, F Paszti, L Pogány, M Fried, E Kotai, G Mezey, T Lohner, ... Nuclear Instruments and Methods in Physics Research 199 (1-2), 409-419, 1982 | 44 | 1982 |
| High-speed imaging/mapping spectroscopic ellipsometry for in-line analysis of roll-to-roll thin-film photovoltaics A Shan, M Fried, G Juhász, C Major, O Polgár, Á Németh, P Petrik, ... IEEE journal of Photovoltaics 4 (1), 355-361, 2013 | 43 | 2013 |
| Comparative study of polysilicon-on-oxide using spectroscopic ellipsometry, atomic force microscopy, and transmission electron microscopy P Petrik, M Fried, T Lohner, R Berger, LP Bı́ró, C Schneider, J Gyulai, ... Thin Solid Films 313, 259-263, 1998 | 43 | 1998 |
| Nanocrystal characterization by ellipsometry in porous silicon using model dielectric function P Petrik, M Fried, E Vazsonyi, P Basa, T Lohner, P Kozma, Z Makkai Journal of Applied Physics 105 (2), 2009 | 38 | 2009 |
| Oxidation of SiC investigated by ellipsometry and Rutherford backscattering spectrometry E Szilágyi, P Petrik, T Lohner, AA Koós, M Fried, G Battistig Journal of Applied Physics 104 (1), 2008 | 37 | 2008 |
| Temperature dependent in situ doping of ALD ZnO Z Baji, Z Lábadi, ZE Horváth, M Fried, B Szentpáli, I Bársony Journal of thermal analysis and calorimetry 105 (1), 93-99, 2011 | 36 | 2011 |