Sebastian Stach

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Ștefan ȚăluUniversitatea Tehnică din Cluj-Napoca, Direcția pentru Managementul Cercetării, Dezvoltării şiVerified email at auto.utcluj.ro
Żaneta Garczyk-MundałaInstitute of Biomedical Engineering | Faculty of Science and Technology | Univeristy of SilesiaVerified email at us.edu.pl
Stanisław RoskoszFaculty of Materials Engineering, Silesian University of TechnologyVerified email at polsl.pl
Mihai TaluVerified email at edu.ucv.ro
Seyed Mohammad ElahiProfessor of physics, science and research Branch, Islamic Azad UniversityVerified email at srbiau.ac.ir
Atefeh GhaderiQuantum Technologies Research Center (QTRC), Science and Research Branch, Islamic Azad UniversityVerified email at alzahra.ac.ir
Shahram SolaymaniHead of Quantum Technologies Research Center, Science and Research Branch, Islamic Azad UniversityVerified email at srbiau.ac.ir
Wiktoria SapotaBiomedical Engineering and Materials Science and Engineering, University of SilesiaVerified email at us.edu.pl
Zygmunt WróbelUniveristy of SilesiaVerified email at us.edu.pl
Dr. Dinesh Pathak Ph. D. PDF (Europe)Univerzita Pardubice, Europe ; Queens University Canada ; University of West Indies; GNDU, IndiaVerified email at upce.cz
Joanna MaszybrockaUniversity of Silesia in Katowice, Institute of Materials ScienceVerified email at us.edu.pl
Carlos Luna CriadoUniversidad Autónoma de Nuevo León (UANL), Facultad de Ciencias Físico Matemáticas (FCFM), CICFiMVerified email at uanl.edu.mx
Nader GhobadiPhysics Department, Faculty of Science, Malayer University, Malayer, IranVerified email at malayeru.ac.ir
Rostam Moradianprofessor of physics, Razi University, Kermanshah, IranVerified email at razi.ac.ir
Asja ČelebićStomatološki fakultet Sveučilišta u ZagrebuVerified email at sfzg.hr
Negin Beryani NezafatPostdoc, University of Duisburg-EssenVerified email at uni-due.de
Aman MahajanProfessor in Physics, Guru Nanak Dev University, AmritsarVerified email at gndu.ac.in
Dr. Anshul Kumar SharmaDepartment of Higher Education, Govt. of Himachal Pradesh/Guru Nanak Dev University, AmritsarVerified email at gndu.ac.in
Grzegorz DerczInstitute of Materials Engineering, Faculty of Science and Technology, University of SilesiaVerified email at us.edu.pl
Zainuriah HassanUniversiti Sains MalaysiaVerified email at usm.my

Sebastian Stach

University of Silesia in Katowice, Faculty of Science and Technology, Institute of Biomedical Engine

Verified email at us.edu.pl - Homepage

biomedical engineering fracture surface multifractal analysis confocal microscopy


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AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates D Dallaeva, Ş Ţălu, S Stach, P Škarvada, P Tománek, L Grmela Applied Surface Science 312, 81-86, 2014	111	2014
Usefulness of 3D surface roughness parameters for nondestructive evaluation of pull-off adhesion of concrete layers J Hoła, Ł Sadowski, J Reiner, S Stach Construction and Building Materials 84, 111-120, 2015	104	2015
Characterization of ETL 9357FLA photomultiplier tubes for cryogenic temperature applications A Ankowski, M Antonello, P Aprili, F Arneodo, A Badertscher, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2006	80	2006
Multifractal description of fracture morphology: theoretical basis S Stach, J Cybo Materials characterization 51 (1), 79-86, 2003	80	2003
Stereometric parameters of the Cu/Fe NPs thin films S Stach, Z Garczyk, S Talu, S Solaymani, A Ghaderi, R Moradian, ... The Journal of Physical Chemistry C 119 (31), 17887-17898, 2015	78	2015
Morphological features in aluminum nitride epilayers prepared by magnetron sputtering S Stach, D Dallaeva, Ş Ţălu, P Kaspar, P Tománek, S Giovanzana, ... Materials Science-Poland 33 (1), 175-184, 2015	73	2015
Topographic characterization of Cu–Ni NPs@ aC: H films by AFM and multifractal analysis S Talu, S Stach, T Ghodselahi, A Ghaderi, S Solaymani, A Boochani, ... The Journal of Physical Chemistry B 119 (17), 5662-5670, 2015	72	2015
3-D surface stereometry studies of sputtered TiN thin films obtained at different substrate temperatures S Stach, W Sapota, Ş Ţălu, A Ahmadpourian, C Luna, N Ghobadi, ... Journal of Materials Science: Materials in Electronics 28, 2113-2122, 2017	69	2017
Surface morphology of titanium nitride thin films synthesized by DC reactive magnetron sputtering Ş Ţǎlu, S Stach, S Valedbagi, SM Elahi, R Bavadi Materials Science-Poland 33 (1), 137-143, 2015	64	2015
Multifractal spectra of atomic force microscope images of Cu/Fe nanoparticles based films thickness Ş Ţălu, S Stach, S Solaymani, R Moradian, A Ghaderi, MR Hantehzadeh, ... Journal of Electroanalytical Chemistry 749, 31-41, 2015	63	2015
Multifractal characterization of nanostructure surfaces of electrodeposited Ni-P coatings Ş Ţălu, S Stach, A Méndez, G Trejo, M Ţălu Journal of the Electrochemical Society 161 (1), D44, 2013	61	2013
Epitaxy of silicon carbide on silicon: Micromorphological analysis of growth surface evolution R Shikhgasan, Ţ Ştefan, S Dinara, S Sebastian, R Guseyn Superlattices and Microstructures 86, 395-402, 2015	58	2015
Multifractal analysis of drop‐casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates Ş Ţălu, S Stach, A Mahajan, D Pathak, T Wagner, A Kumar, RK Bedi Surface and Interface Analysis 46 (6), 393-398, 2014	57	2014
Surface roughness characterization of poly (methylmethacrylate) films with immobilized Eu (III) β-Diketonates by fractal analysis Ş Ţălu, S Stach, J Zaharieva, M Milanova, D Todorovsky, S Giovanzana International Journal of Polymer Analysis and Characterization 19 (5), 404-421, 2014	57	2014
Multifractal characterization of water soluble copper phthalocyanine based films surfaces Ş Ţălu, S Stach, A Mahajan, D Pathak, T Wagner, A Kumar, RK Bedi, ... Electronic Materials Letters 10, 719-730, 2014	56	2014
Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation Ş Ţălu, Z Marković, S Stach, BT Marković, M Ţălu Applied Surface Science 289, 97-106, 2014	56	2014
Fracture surface--fractal or multifractal? S Stach, J Cybo, J Chmiela Materials Characterization 46 (2-3), 163-167, 2001	56	2001
Multifractal characteristics of titanium nitride thin films Ş Ţălu, S Stach, S Valedbagi, R Bavadi, SM Elahi, M Ţălu Materials Science-Poland 33 (3), 541-548, 2015	55	2015
Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al_0.08In_0.08Ga_0.84N thin film assessed by atomic force microscopy and fractal … Ş Ţălu, AJ Ghazai, S Stach, A Hassan, Z Hassan, M Ţălu Journal of Materials Science: Materials in Electronics 25, 466-477, 2014	54	2014
Morphology and optical properties of SiO2-based composite thin films with immobilized terbium (III) complex with a biscoumarin derivative D Elenkova, J Zaharieva, M Getsova, I Manolov, M Milanova, S Stach, ... International Journal of Polymer Analysis and Characterization 20 (1), 42-56, 2015	53	2015

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