Three-dimensional observation of the conductive filament in nanoscaled resistive memory devices U Celano, L Goux, A Belmonte, K Opsomer, A Franquet, A Schulze, ... Nano letters 14 (5), 2401-2406, 2014 | 373 | 2014 |
High-k dielectrics for future generation memory devices JA Kittl, K Opsomer, M Popovici, N Menou, B Kaczer, XP Wang, ... Microelectronic engineering 86 (7-9), 1789-1795, 2009 | 309 | 2009 |
Effect of bath concentration and curing time on the structure of non-functional thin organosilane layers on aluminium A Franquet, C Le Pen, H Terryn, J Vereecken Electrochimica Acta 48 (9), 1245-1255, 2003 | 275 | 2003 |
Organic and perovskite solar cells for space applications I Cardinaletti, T Vangerven, S Nagels, R Cornelissen, D Schreurs, J Hruby, ... Solar Energy Materials and Solar Cells 182, 121-127, 2018 | 206 | 2018 |
Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry A Franquet, J De Laet, T Schram, H Terryn, V Subramanian, WJ Van Ooij, ... Thin Solid Films 384 (1), 37-45, 2001 | 180 | 2001 |
Crystalline properties and strain relaxation mechanism of CVD grown GeSn F Gencarelli, B Vincent, J Demeulemeester, A Vantomme, A Moussa, ... ECS Journal of Solid State Science and Technology 2 (4), P134, 2013 | 165 | 2013 |
XPS study of the atmospheric corrosion of copper alloys of archaeological interest V Hayez, A Franquet, A Hubin, H Terryn Surface and Interface Analysis: An International Journal devoted to the …, 2004 | 154 | 2004 |
Silane coating of metal substrates: Complementary use of electrochemical, optical and thermal analysis for the evaluation of film properties I De Graeve, J Vereecken, A Franquet, T Van Schaftinghen, H Terryn Progress in Organic Coatings 59 (3), 224-229, 2007 | 144 | 2007 |
Composition and thickness of non-functional organosilane films coated on aluminium studied by means of infra-red spectroscopic ellipsometry A Franquet, H Terryn, J Vereecken Thin Solid Films 441 (1-2), 76-84, 2003 | 141 | 2003 |
IRSE study on effect of thermal curing on the chemistry and thickness of organosilane films coated on aluminium A Franquet, H Terryn, J Vereecken Applied Surface Science 211 (1-4), 259-269, 2003 | 110 | 2003 |
Vacancy-modulated conductive oxide resistive RAM (VMCO-RRAM): An area-scalable switching current, self-compliant, highly nonlinear and wide on/off-window resistive switching cell B Govoreanu, A Redolfi, L Zhang, C Adelmann, M Popovici, S Clima, ... 2013 IEEE International Electron Devices Meeting, 10.2. 1-10.2. 4, 2013 | 105 | 2013 |
Study of the effect of different aluminium surface pretreatments on the deposition of thin non‐functional silane coatings A Franquet, H Terryn, J Vereecken Surface and Interface Analysis: An International Journal devoted to the …, 2004 | 97 | 2004 |
Metal‐Insulator Transition in ALD VO2 Ultrathin Films and Nanoparticles: Morphological Control AP Peter, K Martens, G Rampelberg, M Toeller, JM Ablett, J Meersschaut, ... Advanced Functional Materials 25 (5), 679-686, 2015 | 91 | 2015 |
Impact of the electrodeposition chemistry used for TSV filling on the microstructural and thermo-mechanical response of Cu C Okoro, R Labie, K Vanstreels, A Franquet, M Gonzalez, B Vandevelde, ... Journal of Materials Science 46, 3868-3882, 2011 | 91 | 2011 |
Characterisation of the silicon nitride thin films deposited by plasma magnetron A Batan, A Franquet, J Vereecken, F Reniers Surface and Interface Analysis: An International Journal devoted to the …, 2008 | 61 | 2008 |
Material-Selective Doping of 2D TMDC through AlxOy Encapsulation A Leonhardt, D Chiappe, VV Afanas’ ev, S El Kazzi, I Shlyakhov, ... ACS applied materials & interfaces 11 (45), 42697-42707, 2019 | 59 | 2019 |
Atomic layer deposition of ruthenium thin films from (ethylbenzyl)(1-ethyl-1, 4-cyclohexadienyl) Ru: Process characteristics, surface chemistry, and film properties M Popovici, B Groven, K Marcoen¶, QM Phung, S Dutta, J Swerts, ... Chemistry of Materials 29 (11), 4654-4666, 2017 | 58 | 2017 |
Use of optical methods to characterize thin silane films coated on aluminium A Franquet, H Terryn, P Bertrand, J Vereecken Surface and Interface Analysis: An International Journal devoted to the …, 2002 | 57 | 2002 |
Gate-last vs. gate-first technology for aggressively scaled EOT logic/RF CMOS A Veloso, LÅ Ragnarsson, MJ Cho, K Devriendt, K Kellens, F Sebaai, ... 2011 Symposium on VLSI Technology-Digest of Technical Papers, 34-35, 2011 | 56 | 2011 |
Nucleation and growth mechanisms of Al2O3 atomic layer deposition on synthetic polycrystalline MoS2 H Zhang, D Chiappe, J Meersschaut, T Conard, A Franquet, T Nuytten, ... The Journal of Chemical Physics 146 (5), 2017 | 55 | 2017 |