| Robust DfT techniques for built-in fault detection in operational amplifiers with high coverage M Saikiran, M Ganji, D Chen 2020 IEEE International Test Conference (ITC), 1-10, 2020 | 16 | 2020 |
| All digital low-overhead sar adc built-in self-test for fault detection and diagnosis M Ganji, M Saikiran, D Chen 2022 IEEE 40th VLSI Test Symposium (VTS), 1-7, 2022 | 13 | 2022 |
| Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection M Saikiran, M Ganji, D Chen 2022 IEEE International Symposium on Circuits and Systems (ISCAS), 1580-1584, 2022 | 12 | 2022 |
| A Time-Efficient Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits M Saikiran, M Ganji, D Chen 2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems …, 2022 | 10 | 2022 |
| Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators M Saikiran, M Ganji, D Chen 2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems …, 2022 | 9 | 2022 |
| Low-cost defect simulation framework for analog and mixed signal (AMS) circuits with enhanced time-efficiency M Saikiran, M Sekyere, M Ganji, R Yang, D Chen Analog Integrated Circuits and Signal Processing 117 (1), 73-94, 2023 | 8 | 2023 |
| A Wide-Range Low-cost Temperature to Digital Converter Independent of Device Models M Ganji, M Saikiran, D Chen 2022 IEEE International Symposium on Circuits and Systems (ISCAS), 605-609, 2022 | 3 | 2022 |
| Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency M Saikiran, M Sekyere, M Ganji, D Chen 2023 IEEE East-West Design & Test Symposium (EWDTS), 1-6, 2023 | 2 | 2023 |
| Digital-Like Built-In Defect-Oriented Test for Analog-Mixed Signal Circuits M Ganji, M Saikiran, K Bhatheja, D CHEN Authorea Preprints, 2023 | 1 | 2023 |
| Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview M Saikiran, M Sekyere, M Ganji, D Chen 2023 IEEE East-West Design & Test Symposium (EWDTS), 1-5, 2023 | 1 | 2023 |
| Wide range temperature-to-digital converter without explicit data converters M Ganji, DJ Chen US Patent App. 18/095,853, 2024 | | 2024 |
| Analog and mixed-signal design and test techniques for improved reliability M Ganji Iowa State University, 2024 | | 2024 |
| Department of Electrical and Computer Engineering, Iowa State University Modified from a manuscript submitted to 2020 IEEE International Test Conference (ITC) M Saikiran, M Ganji, D Chen | | |
| Department of Electrical and Computer Engineering, Iowa State University Modified from a manuscript submitted to 2023 Symposium on Integrated Circuits and Systems Design M Saikiran, M Sekyere, M Ganji, D Chen | | |
