Self-consistent optical constants of SiO2 and Ta2O5 films LV Rodríguez-de Marcos, JI Larruquert, JA Méndez, JA Aznárez Optical Materials Express 6 (11), 3622-3637, 2016 | 322 | 2016 |
Self-consistent optical constants of SiC thin films JI Larruquert, AP Pérez-Marín, S García-Cortés, L Rodríguez-de Marcos, ... JOSA A 28 (11), 2340-2345, 2011 | 124 | 2011 |
Self-consistent optical constants of MgF2, LaF3, and CeF3 films LV Rodríguez-de Marcos, JI Larruquert, JA Méndez, JA Aznárez Optical Materials Express 7 (3), 989-1006, 2017 | 105 | 2017 |
Far ultraviolet optical properties of MgF2 films deposited by ion-beam sputtering and their application as protective coatings for Al JI Larruquert, RAM Keski-Kuha Optics communications 215 (1-3), 93-99, 2003 | 70 | 2003 |
Multilayer coatings with high reflectance in the extreme-ultraviolet spectral range of 50 to 121.6 nm JI Larruquert, RAM Keski-Kuha Applied optics 38 (7), 1231-1236, 1999 | 60 | 1999 |
High reflectance ta-C coatings in the extreme ultraviolet JI Larruquert, LV Rodríguez-de Marcos, JA Méndez, PJ Martin, ... Optics express 21 (23), 27537-27549, 2013 | 58 | 2013 |
Mirrors for space telescopes: Degradation issues D Garoli, LV Rodriguez De Marcos, JI Larruquert, AJ Corso, ... Applied Sciences 10 (21), 7538, 2020 | 54 | 2020 |
Optimization of MgF2-deposition temperature for far UV Al mirrors LVR De Marcos, JI Larruquert, JA Méndez, N Gutiérrez-Luna, ... Optics express 26 (7), 9363-9372, 2018 | 49 | 2018 |
Reflectance enhancement in the extreme ultraviolet and soft x rays by means of multilayers with more than two materials JI Larruquert JOSA A 19 (2), 391-397, 2002 | 48 | 2002 |
Reflectance measurements and optical constants in the extreme ultraviolet for thin films of ion-beam-deposited SiC, Mo, Mg2Si, and InSb and of evaporated Cr JI Larruquert, RAM Keski-Kuha Applied optics 39 (16), 2772-2781, 2000 | 43 | 2000 |
Triple-wavelength, narrowband Mg/SiC multilayers with corrosion barriers and high peak reflectance in the 25-80 nm wavelength region M Fernández-Perea, R Soufli, JC Robinson, LR De Marcos, JA Méndez, ... Optics Express 20 (21), 24018-24029, 2012 | 42 | 2012 |
Analytic optical-constant model derived from Tauc-Lorentz and Urbach tail LV Rodríguez-de Marcos, JI Larruquert Optics express 24 (25), 28561-28572, 2016 | 40 | 2016 |
Self-consistent optical constants of sputter-deposited thin films JI Larruquert, AP Pérez-Marín, S García-Cortés, L Rodríguez-de Marcos, ... Journal of the Optical Society of America A 29 (1), 117-123, 2011 | 40 | 2011 |
Reflectance enhancement with sub-quarterwave multilayers of highly absorbing materials JI Larruquert JOSA A 18 (6), 1406-1414, 2001 | 39 | 2001 |
Far-ultraviolet reflectance measurements and optical constants of unoxidized aluminum films JI Larruquert, JA Méndez, JA Aznárez Applied optics 34 (22), 4892-4899, 1995 | 38 | 1995 |
Far‐ultraviolet absolute reflectometer for optical constant determination of ultrahigh vacuum prepared thin films JA Aznárez, JI Larruquert, JA Méndez Review of scientific instruments 67 (2), 497-502, 1996 | 37 | 1996 |
Determination of optical constants of scandium films in the 20-1000 eV range M Fernández-Perea, JI Larruquert, JA Aznárez, JA Méndez, L Poletto, ... JOSA A 23 (11), 2880-2887, 2006 | 36 | 2006 |
Optical properties of ytterbium films in the far and the extreme ultraviolet JI Larruquert, JA Aznárez, JA Méndez, J Calvo-Angós Applied optics 42 (22), 4566-4572, 2003 | 34 | 2003 |
New layer-by-layer multilayer design method JI Larruquert JOSA A 19 (2), 385-390, 2002 | 34 | 2002 |
Optical constants of electron-beam evaporated boron films in the 6.8-900 eV photon energy range M Fernández-Perea, JI Larruquert, JA Aznárez, JA Méndez, ... JOSA A 24 (12), 3800-3807, 2007 | 33 | 2007 |