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Co-authors
- Dmitri StrukovProfessor of Electrical and Computer Engineering, University of California, Santa BarbaraVerified email at ece.ucsb.edu
- Ligang GaoDepartment of Electrical Engineering, Arizona State UniversityVerified email at asu.edu
- Selina La BarberaSpringer NatureVerified email at springernature.com
- Olivier BichlerCEA, LISTVerified email at cea.fr
- Damien QuerliozResearch Scientist, CNRS, Université Paris-SaclayVerified email at u-psud.fr
- Bernabe Linares-BarrancoInstituto de Microelectrónica de Sevilla, IMSE-CNM, Universidad de Sevilla, CSICVerified email at imse-cnm.csic.es
- Brian D. HoskinsPhysicist | National Institute of Standards and TechnologyVerified email at nist.gov
- Adrien F. VincentIMS, Bordeaux, FranceVerified email at ims-bordeaux.fr
- Farnood Merrikh BayatUniversity of California Santa BarbaraVerified email at ece.ucsb.edu
- Sandra RodilInstituto de Investigaciones en Materiales, Universidad Nacional Autónoma de MéxicoVerified email at unam.mx