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Co-authors
- Joseph W. LydingProfessor of Electrical and Computer Engineering, University of IllinoisVerified email at illinois.edu
- Shashank MisraSandia National LaboratoriesVerified email at sandia.gov
- Joshua D. WoodPrincipal Solutions Engineer, DynatraceVerified email at dynatrace.com
- Evan M AndersonSandia National Labs, University of MichiganVerified email at sandia.gov
- Tzu-Ming LuSandia National LaboratoriesVerified email at sandia.gov
- Richard SilverNISTVerified email at nist.gov
- Jon WyrickVerified email at nist.gov
- Pradeep NamboodiriPhysicistVerified email at nist.gov
- Ranjit KashidScientist, Centre for Materials for Electronics TechnologyVerified email at cmet.gov.in
- Cory D. CressMaterials Research Engineer, Naval Research LaboratoryVerified email at nrl.navy.mil
- Ezra BussmannSandia National LaboratoriesVerified email at sandia.gov
- Jeremy T RobinsonUS Naval Research LaboratoryVerified email at nrl.navy.mil
- Eric PopPease-Ye Professor of Electrical Engineering, MSE, AP at Stanford & SLACVerified email at stanford.edu
- John N. RandallZyvex LabsVerified email at zyvexlabs.com
- Adam L FriedmanLaboratory for Physical Sciences, University of Maryland, Naval Research LaboratoryVerified email at lps.umd.edu
- Michael StewartPhysicist, National Institute of Standards and TechnologyVerified email at nist.gov
- Kevin HeGraduate Student, UIUCVerified email at illinois.edu
- N. AluruMechanical Engineering, Oden Institute, University of Texas at Austin; Previous: UIUCVerified email at utexas.edu
- Mark HersamNorthwestern UniversityVerified email at northwestern.edu
- Heather ArnoldNorthwestern UniversityVerified email at u.northwestern.edu