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Co-authors
- Yilmaz SozerProfessor of University of AkronVerified email at uakron.edu
- Erkan MeseEge UniversityVerified email at ege.edu.tr
- Ahmed ElasserSenior Principal Systems Engineer, GE Global Research CenterVerified email at ge.com
- Ayman EL-RefaieMarquette UniversityVerified email at marquette.edu
- Tsarafidy RAMINOSOASenior R&D Staff, Oak Ridge National LaboratoryVerified email at ornl.gov
- Di PanRivianVerified email at rivian.com
- Nathaniel HawesElectrical Engineer, General Electric Global ResearchVerified email at ge.com
- Karthik Kumar BodlaHolo Inc.Verified email at holoam.com
- Muthana T. AlrifaiKuwait UniversityVerified email at ku.edu.kw
- Osman Demirciilahiyat fakültesi karadeniz teknik üniversitesiVerified email at ktu.edu.tr
- Bünyamin TamyürekGazi UniversityVerified email at gazi.edu.tr
- Vandana RallabandiOak Ridge National LaboratoryVerified email at ornl.gov
- JiangBiao HeUniversity of Tennessee, University of Kentucky, GE Global ResearchVerified email at utk.edu