| Thermal failure in semiconductor devices VM Dwyer, AJ Franklin, DS Campbell Solid-state electronics 33 (5), 553-560, 1990 | 255 | 1990 |
| Background intensity determination in AES/XPS VM Dwyer, JAD Matthew Surface science 193 (3), 549-568, 1988 | 60 | 1988 |
| The effects of elastic backscattering on the Auger or X-ray photoelectron spectra of solids VM Dwyer, JAD Matthew Surface science 143 (1), 57-83, 1984 | 59 | 1984 |
| The depth distribution function in Auger/XPS analysis VM Dwyer, JM Richards Surface and interface analysis 18 (7), 555-560, 1992 | 55 | 1992 |
| General approach to quantum mechanics as a statistical theory RP Rundle, T Tilma, JH Samson, VM Dwyer, RF Bishop, MJ Everitt Physical Review A 99 (1), 012115, 2019 | 45 | 2019 |
| Electrostatic discharge thermal failure in semiconductor devices VM Dwyer, AJ Franklin, DS Campbell IEEE Transactions on Electron Devices 37 (11), 2381-2387, 1990 | 44 | 1990 |
| A comparison of electron transport in AES/PES with neutron transport theory VM Dwyer, JAD Matthew Surface Science 152, 884-894, 1985 | 30 | 1985 |
| The role of diffraction in dispersive optical bistability D Weaire, JP Kermode, VM Dwyer Optics communications 55 (3), 223-228, 1985 | 29 | 1985 |
| Reconstruction of the depth profile from angle‐resolved AES/XPS VM Dwyer Surface and interface analysis 20 (8), 687-695, 1993 | 28 | 1993 |
| Asum-over-paths' approach to diffusion on trees PC Bressloff, VM Dwyer, MJ Kearney Journal of Physics A: Mathematical and General 29 (9), 1881, 1996 | 25 | 1996 |
| The effect of elastic scattering on the effective inelastic mean free path VM Dwyer, JAD Matthew Vacuum 33 (10-12), 767-769, 1983 | 23 | 1983 |
| Algorithms and VLSI architectures for MPEG-4 motion estimation S Agha, VM Dwyer Electronic systems and control Division Research, 24-27, 2003 | 22 | 2003 |
| An investigation of electromigration induced void nucleation time statistics in short copper interconnects VM Dwyer Journal of Applied Physics 107 (10), 2010 | 21 | 2010 |
| Towards microbiological quality assurance in radiation sterilization processing: simulation of the radiation inactivation process FR Fitch, PT Doolan, J Dwyer, VM Dwyer, NA Halls, A Tallentire Journal of applied bacteriology 58 (3), 307-313, 1985 | 21 | 1985 |
| Thermal breakdown in GaAs MES diodes AJ Franklin, VM Dwyer, DS Campbell Solid-State Electronics 33 (8), 1055-1064, 1990 | 20 | 1990 |
| Electromigration failure in a finite conductor with a single blocking boundary VM Dwyer, FS Wang, P Donaldson Journal of applied physics 76 (11), 7305-7310, 1994 | 18 | 1994 |
| Angular distribution of electrons elastically backscattered from surfaces VM Dwyer Surface and interface analysis 20 (6), 513-518, 1993 | 18 | 1993 |
| Extraction of inelastic mean free path data from elastic electron backscattering data VM Dwyer Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 12 (5 …, 1994 | 17 | 1994 |
| The effect of short-range order on the vibrational entropy of one-dimensional chains JAD Matthew, RE Jones, VM Dwyer Journal of Physics F: Metal Physics 13 (3), 581, 1983 | 17 | 1983 |
| Experimental and theoretical studies of EOS/ESD oxide breakdown in unprotected MOS structures MJ Tunnicliffe, VM Dwyer, DS Campbell Proc. EOS/ESD Symp 12, 162-168, 1990 | 16 | 1990 |
