Follow
Sudeb Dasgupta
Sudeb Dasgupta
Department of Electronics and Communication Engineering, IIT Roorkee
Verified email at iitr.ac.in
Title
Cited by
Cited by
Year
Device and circuit co-design robustness studies in the subthreshold logic for ultralow-power applications for 32 nm CMOS
R Vaddi, S Dasgupta, RP Agarwal
IEEE Transactions on Electron Devices 57 (3), 654-664, 2010
194*2010
Nanoscale FinFET based SRAM cell design: Analysis of performance metric, process variation, underlapped FinFET, and temperature effect
B Raj, AK Saxena, S Dasgupta
IEEE Circuits and Systems Magazine 11 (3), 38-50, 2011
1492011
Effect of well and substrate potential modulation on single event pulse shape in deep submicron CMOS
S DasGupta, AF Witulski, BL Bhuva, ML Alles, RA Reed, OA Amusan, ...
IEEE Transactions on Nuclear Science 54 (6), 2407-2412, 2007
1332007
Antifungal Activity of Some Plant Extracts Against Fungal Pathogens of Tea (Camellia sinensis.)
D Saha, S Dasgupta, A Saha
Pharmaceutical biology 43 (1), 87-91, 2005
1012005
A Comparative Study of 6T, 8T and 9T Decanano SRAM cell
P Athe, S Dasgupta
2009 IEEE Symposium on Industrial Electronics & Applications 2, 889-894, 2009
982009
Surface potential and drain current analytical model of gate all around triple metal TFET
N Bagga, S Dasgupta
IEEE Transactions on Electron Devices 64 (2), 606-613, 2017
852017
Investigation of symmetric dual-k spacer trigate FinFETs from delay perspective
PK Pal, BK Kaushik, S Dasgupta
IEEE Transactions on Electron Devices 61 (11), 3579-3585, 2014
842014
High-performance and robust SRAM cell based on asymmetric dual-k spacer FinFETs
PK Pal, BK Kaushik, S Dasgupta
IEEE Transactions on Electron Devices 60 (10), 3371-3377, 2013
812013
Analytical modeling for the estimation of leakage current and subthreshold swing factor of nanoscale double gate FinFET device
B Raj, AK Saxena, S Dasgupta
Microelectronics International 26 (1), 53-63, 2009
772009
Demonstration of a novel two source region tunnel FET
N Bagga, A Kumar, S Dasgupta
IEEE Transactions on Electron Devices 64 (12), 5256-5262, 2017
762017
Design and analysis of analog performance of dual-k spacer underlap N/P-FinFET at 12 nm gate length
A Nandi, AK Saxena, S Dasgupta
IEEE transactions on electron devices 60 (5), 1529-1535, 2013
752013
Recent trend of FinFET devices and its challenges: A review
RS Pal, S Sharma, S Dasgupta
2017 Conference on Emerging Devices and Smart Systems (ICEDSS), 150-154, 2017
742017
Analytical modeling of a double gate MOSFET considering source/drain lateral Gaussian doping profile
A Nandi, AK Saxena, S Dasgupta
IEEE Transactions on Electron Devices 60 (11), 3705-3709, 2013
652013
Asymmetric dual-spacer trigate FinFET device-circuit codesign and its variability analysis
PK Pal, BK Kaushik, S Dasgupta
IEEE Transactions on Electron Devices 62 (4), 1105-1112, 2015
612015
FPGA: An efficient and promising platform for real-time image processing applications
S Mittal, S Gupta, S Dasgupta
National Conference On Research and Development In Hardware Systems (CSI-RDHS), 2008
582008
A compact drain current and threshold voltage quantum mechanical analytical modeling for FinFETs
B Raj, AK Saxena, S Dasgupta
Journal of Nanoelectronics and Optoelectronics (JNO), USA 3 (2), 163-170, 2008
562008
Two dimensional analytical modeling for asymmetric 3T and 4T double gate tunnel FET in sub-threshold region: Potential and electric field
M Yadav, A Bulusu, S Dasgupta
Microelectronics Journal 44 (12), 1251-1259, 2013
542013
Quantum mechanical analytical modeling of nanoscale DG FinFET: evaluation of potential, threshold voltage and source/drain resistance
B Raj, AK Saxena, S Dasgupta
Materials science in semiconductor processing 16 (4), 1131-1137, 2013
512013
System generator: The state-of-art FPGA design tool for dsp applications
S Mittal, S Gupta, S Dasgupta
Third International Innovative Conference On Embedded Systems, Mobile …, 2008
442008
Impact of random spatial fluctuation in non-uniform crystalline phases on the device variation of ferroelectric FET
C Garg, N Chauhan, S Deng, AI Khan, S Dasgupta, A Bulusu, K Ni
IEEE Electron Device Letters 42 (8), 1160-1163, 2021
392021
The system can't perform the operation now. Try again later.
Articles 1–20