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Co-authors
- Stefano SalvatoriProfessore Associato di Elettronica, Università degli Studi Niccolò CusanoVerified email at unicusano.it
- Marco FanciulliProfessor of Condensed Matter Physics, University of Milano BicoccaVerified email at unimib.it
- Marco De MichielisCNR-IMM Sede di Agrate BrianzaVerified email at mdm.imm.cnr.it
- Eli YablonovitchVerified email at eecs.berkeley.edu
- Simone CoccoIMM-CNR, MDM laboratory, Agrate Brianza (MB)Verified email at mdm.imm.cnr.it
- Belli MatteoLaboratorio MDM, CNR-IMM, U.O.S. di Agrate BrianzaVerified email at mdm.imm.cnr.it
- Davide RottaPhD, Università di Milano BicoccaVerified email at campus.unimib.it
- Elena FerraroIstituto Microelettronica e Microsistemi - CNR - Agrate Brianza (MB) ItaliaVerified email at mdm.imm.cnr.it
- Filippo GuagliardoPolitecnico di MilanoVerified email at mail.polimi.it
- Yasuo ShimizuSony Semiconductor Solutions CorporationVerified email at sony.com
- r. wacquezCEAVerified email at cea.fr
- Daniele M. TrucchiCNR-ISM Istituto di Struttura della MateriaVerified email at mlib.ism.cnr.it
- Giorgio FerrariPolitecnico di Milano, Dipartimento di FisicaVerified email at polimi.it
- Guillaume LETIKorea UniversityVerified email at korea.ac.kr
- E A FitzgeraldCornell, ATT, MIT, Massachusetts Institute of Technology, NTUVerified email at mit.edu
- Sapan AgarwalSandia National LaboratoriesVerified email at sandia.gov
- (John) Xiupu ZhangConcordia UniversityVerified email at ece.concordia.ca
- Xueji ZhangShenzhen University, University of Science & Technology, Beijing. University of South Florida, World