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Mariano A. Real
Mariano A. Real
Department of Quantum Metrology, Instituto Nacional de Tecnología Industrial (INTI), Argentina
Verified email at inti.gob.ar - Homepage
Title
Cited by
Cited by
Year
Low carrier density epitaxial graphene devices on SiC
Y Yang, LI Huang, Y Fukuyama, FH Liu, MA Real, P Barbara, CT Liang, ...
Small 11 (1), 90-95, 2015
752015
Graphene epitaxial growth on SiC (0001) for resistance standards
MA Real, EA Lass, FH Liu, T Shen, GR Jones, JA Soons, DB Newell, ...
IEEE Transactions on Instrumentation and Measurement 62 (6), 1454-1460, 2013
532013
Optimal thermoelectricity with quantum Spin Hall edge states
D Gresta, M Real, L Arrachea
Physical review letters 123 (18), 186801, 2019
252019
Undergraduate experiment to measure the speed of sound in liquid by diffraction of light
DA Luna, MA Real, DV Durán
American Journal of Physics 70 (8), 874-875, 2002
122002
Thermoelectricity in quantum hall corbino structures
M Real, D Gresta, C Reichl, J Weis, A Tonina, P Giudici, L Arrachea, ...
Physical Review Applied 14 (3), 034019, 2020
112020
Thermoelectric cooling properties of a quantum Hall Corbino device
J Herrera Mateos, MA Real, C Reichl, A Tonina, W Wegscheider, ...
Physical Review B 103 (12), 125404, 2021
52021
A model dielectric function for graphene from the infrared to the ultraviolet
A Boosalis, R Elmquist, M Real, N Nguyen, M Schubert, T Hofmann
MRS Online Proceedings Library (OPL) 1505, mrsf12-1505-w10-80, 2013
22013
Bilateral Comparison of 1.018 V and 10 V Standards between the INTI (Argentina) and the BIPM, August to October 2009 (part of the ongoing BIPM key comparison BIPM. EM-K11. a and b)
A Tonina, R Iuzzolino, M Bierzychudek, M Real, S Solve, R Chayramy, ...
Metrologia 47 (1A), 01002-01002, 2010
22010
Design and fabrication of high value standard resistors at INTI
M Bierzychudek, R Garcia, M Real, A Tonina
2008 Conference on Precision Electromagnetic Measurements Digest, 396-397, 2008
22008
Differential Measurement Techniques using a Programmable Josephson Voltage Standard
E Luna, G Schneider, M Real, R Iuzzolino
2024 Argentine Conference on Electronics (CAE), 32-35, 2024
12024
Characteristics of graphene for quantized hall effect measurements
RE Elmquist, T Shen, M Real, IG Calizo, BG Bush, G He, Y Yang, ...
2012 Conference on Precision electromagnetic Measurements, 514-515, 2012
12012
Graphene production for electrical metrology
RE Elmquist, T Shen, FL Hernandez-Marquez, MA Real, DB Newell
Elektronika: konstrukcje, technologie, zastosowania 52 (6), 22-25, 2011
12011
Application of LSTMs Recurrent Neural Networks to Characterize a Digitizer Using a Quantum Voltage Standard
G Schneider, M Real, R Iuzzolino
2024 IEEE Biennial Congress of Argentina (ARGENCON), 1-5, 2024
2024
A Novel Method for Multitone Signal Characterization Using the AC Quantum Voltmeter
E Luna, R Iuzzolino, L Palafox, M Real, R Behr
2024 Conference on Precision Electromagnetic Measurements (CPEM), 1-2, 2024
2024
Controlled generation and detection of a thermal bias in Corbino devices under the quantum Hall regime
MA Real, A Tonina, L Arrachea, P Giudici, C Reichl, W Wegscheider, ...
Applied Physics Letters 122 (10), 2023
2023
Capacidades de los sistemas Josephson programable y pulsado
E Luna, G Schneider, DP Zárate, M Real, R Iuzzolino, A Tonina
2022 IEEE Biennial Congress of Argentina (ARGENCON), 1-7, 2022
2022
Automatización en la medición de impedancias
J Medved, M Real, M Cazabat, A Tonina
2022 IEEE Biennial Congress of Argentina (ARGENCON), 1-5, 2022
2022
Thermoelectricity in Corbino devices in the quantum Hall regime
MA Real, D Gresta, A Tonina, L Arrachea, W Dietsche
2020 Conference on Precision Electromagnetic Measurements (CPEM), 1-2, 2020
2020
Exploring Corbino Structures for Thermoelectric Transport Under QHE Regime
MA Real, P Giudici, D Gresta, J Sicpc, A Tonina, L Arrachea, W Dietsche
2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 1-2, 2018
2018
Development of low carrier density graphene devices
Y Yang, LI Huang, DB Newell, Y Fukuyama, MA Real, RE Elmquist
29th Conference on Precision Electromagnetic Measurements (CPEM 2014), 34-35, 2014
2014
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