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Mark Bieler
Mark Bieler
Verified email at ptb.de
Title
Cited by
Cited by
Year
Ultrafast shift and injection currents observed in wurtzite semiconductors via emitted terahertz radiation
N Laman, M Bieler, HM Van Driel
Journal of applied physics 98 (10), 2005
1072005
Simultaneous generation of shift and injection currents in (110)-grown GaAs∕ AlGaAs quantum wells
M Bieler, K Pierz, U Siegner
Journal of applied physics 100 (8), 2006
622006
Ultrafast spin-polarized electrical currents injected in a strained zinc blende semiconductor by single color pulses
M Bieler, N Laman, HM Van Driel, AL Smirl
Applied Physics Letters 86 (6), 2005
612005
Optoelectronic time-domain characterization of a 100 GHz sampling oscilloscope
H Füser, S Eichstädt, K Baaske, C Elster, K Kuhlmann, R Judaschke, ...
Measurement Science and Technology 23 (2), 025201, 2011
492011
Shift currents from symmetry reduction and Coulomb effects in (110)-orientated quantum wells
M Bieler, K Pierz, U Siegner, P Dawson
Physical Review B—Condensed Matter and Materials Physics 76 (16), 161304, 2007
482007
All-semiconductor laser driven terahertz time-domain spectrometer
C Jördens, T Schlauch, M Li, MR Hofmann, M Bieler, M Koch
Applied Physics B 93, 515-520, 2008
392008
THz generation from resonant excitation of semiconductor nanostructures: Investigation of second-order nonlinear optical effects
M Bieler
IEEE Journal of Selected Topics in Quantum Electronics 14 (2), 458-469, 2008
382008
High-precision frequency measurements in the THz spectral region using an unstabilized femtosecond laser
H Füser, R Judaschke, M Bieler
Applied Physics Letters 99 (12), 2011
372011
Rise-time calibration of 50-GHz sampling oscilloscopes: Intercomparison between PTB and NPL
M Bieler, S Seitz, M Spitzer, G Hein, K Pierz, U Siegner, MA Basu, ...
IEEE Transactions on instrumentation and measurement 56 (2), 266-270, 2007
352007
Optoelectronic measurement of the transfer function and time response of a 70 GHz sampling oscilloscope
S Seitz, M Bieler, M Spitzer, K Pierz, G Hein, U Siegner
Measurement science and technology 16 (10), L7, 2005
352005
Anisotropic homogeneous linewidth of the heavy-hole exciton in (110)-oriented GaAs quantum wells
R Singh, TM Autry, G Nardin, G Moody, H Li, K Pierz, M Bieler, ST Cundiff
Physical Review B—Condensed Matter and Materials Physics 88 (4), 045304, 2013
342013
The problem of calibrating laser-Doppler vibrometers at high frequencies
M Winter, H Füser, M Bieler, G Siegmund, C Rembe
AIP Conference Proceedings 1457 (1), 165-175, 2012
312012
Reversal of Coherently Controlled Ultrafast Photocurrents by Band Mixing<? format?> in Undoped GaAs Quantum Wells
S Priyadarshi, AM Racu, K Pierz, U Siegner, M Bieler, HT Duc, J Förstner, ...
Physical review letters 104 (21), 217401, 2010
312010
THz metrology
T Kleine-Ostmann, T Schrader, M Bieler, U Siegner, C Monte, ...
Frequenz 62 (5-6), 137-148, 2008
312008
Traceability of high-speed electrical waveforms at NIST, NPL, and PTB
PD Hale, DF Williams, A Dienstfrey, J Wang, J Jargon, D Humphreys, ...
2012 Conference on Precision electromagnetic Measurements, 522-523, 2012
302012
Time-domain optoelectronic vector network analysis on coplanar waveguides
M Bieler, H Füser, K Pierz
IEEE Transactions on Microwave Theory and Techniques 63 (11), 3775-3784, 2015
292015
All-optically induced ultrafast photocurrents: beyond the instantaneous coherent response
S Priyadarshi, K Pierz, M Bieler
Physical Review Letters 109 (21), 216601, 2012
292012
Terahertz spectroscopy of shift currents resulting from asymmetric (110)-oriented GaAs/AlGaAs quantum wells
S Priyadarshi, M Leidinger, K Pierz, AM Racu, U Siegner, M Bieler, ...
Applied Physics Letters 95 (15), 2009
282009
Improved optoelectronic technique for the time-domain characterization of sampling oscilloscopes
M Bieler, M Spitzer, K Pierz, U Siegner
IEEE Transactions on Instrumentation and Measurement 58 (4), 1065-1071, 2008
272008
Quantum interference currents by excitation of heavy- and light-hole excitons in quantum wells
M Bieler, K Pierz, U Siegner, P Dawson
Physical Review B—Condensed Matter and Materials Physics 73 (24), 241312, 2006
262006
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