Follow
Christoph Hofer
Title
Cited by
Cited by
Year
Isotope analysis in the transmission electron microscope
T Susi, C Hofer, G Argentero, GT Leuthner, TJ Pennycook, C Mangler, ...
Nature communications 7 (1), 13040, 2016
942016
Engineering single-atom dynamics with electron irradiation
C Su, M Tripathi, QB Yan, Z Wang, Z Zhang, C Hofer, H Wang, L Basile, ...
Science advances 5 (5), eaav2252, 2019
832019
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications
D Jannis, C Hofer, C Gao, X Xie, A Béché, TJ Pennycook, J Verbeeck
Ultramicroscopy 233, 113423, 2022
642022
Direct imaging of light-element impurities in graphene reveals triple-coordinated oxygen
C Hofer, V Skákalová, T Görlich, M Tripathi, A Mittelberger, C Mangler, ...
Nature Communications 10 (1), 4570, 2019
542019
Toward exotic layered materials: 2D cuprous iodide
K Mustonen, C Hofer, P Kotrusz, A Markevich, M Hulman, C Mangler, ...
Advanced Materials 34 (9), 2106922, 2022
442022
Tailoring electronic and magnetic properties of graphene by phosphorus doping
R Langer, P Błoński, C Hofer, P Lazar, K Mustonen, JC Meyer, T Susi, ...
ACS applied materials & interfaces 12 (30), 34074-34085, 2020
232020
Atomic-scale deformations at the interface of a mixed-dimensional van der waals heterostructure
K Mustonen, A Hussain, C Hofer, MRA Monazam, R Mirzayev, K Elibol, ...
ACS nano 12 (8), 8512-8519, 2018
212018
Revealing the 3D structure of graphene defects
C Hofer, C Kramberger, MRA Monazam, C Mangler, A Mittelberger, ...
2D Materials 5 (4), 045029, 2018
172018
Direct visualization of the 3D structure of silicon impurities in graphene
C Hofer, V Skakalova, MRA Monazam, C Mangler, J Kotakoski, T Susi, ...
Applied Physics Letters 114 (5), 2019
162019
Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science
C Gao, C Hofer, D Jannis, A Béché, J Verbeeck, TJ Pennycook
Applied Physics Letters 121 (8), 2022
152022
Aligned Stacking of Nanopatterned 2D Materials for High-Resolution 3D Device Fabrication
J Haas, F Ulrich, C Hofer, X Wang, K Braun, JC Meyer
ACS nano 16 (2), 1836-1846, 2022
152022
Automated image acquisition for low-dose STEM at atomic resolution
A Mittelberger, C Kramberger, C Hofer, C Mangler, JC Meyer
Microscopy and Microanalysis 23 (4), 809-817, 2017
152017
Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations
C Hofer, V Skákalová, J Haas, X Wang, K Braun, RS Pennington, ...
Ultramicroscopy 227, 113292, 2021
92021
Analysis of point defects in graphene using low dose scanning transmission electron microscopy imaging and maximum likelihood reconstruction
C Kramberger, A Mittelberger, C Hofer, JC Meyer
physica status solidi (b) 254 (11), 1700176, 2017
62017
Detecting charge transfer in defective 2D WS2 with electron ptychography
C Hofer, J Madson, T Susi, TJ Pennycook
arXiv preprint arXiv:2301.04469, 2023
22023
Understanding and exploiting the interaction of electron beams with low-dimensional materials-from controlled atomic-level manipulation to circumventing radiation damage
T Susi, A Mittelberger, C Kramberger, C Mangier, C Hofer, TJ Pennycook, ...
Microscopy and Microanalysis 23 (S1), 196-197, 2017
22017
Ab initio electrostatic potentials for 4D-stem ptychographic reconstruction
J Madsen, C Hofer, TC Pekin, M Schloz, TA Bui, C Koch, TJ Pennycook, ...
Microscopy and Microanalysis 28 (S1), 392-393, 2022
12022
Few-tilt Electron Ptychotomography: A New Method to Determine the 3D Structure of 2D Materials with High-precision and Low-dose
C Hofer, K Mustonen, V Skákalová, TJ Pennycook
Microscopy and Microanalysis 28 (S1), 2526-2527, 2022
12022
Analysis of point defects in graphene using low dose scanning transmission electron microscopy imaging and maximum likelihood reconstruction
C Kramberger, A Mittelberger, C Hofer, JC Meyer
arXiv preprint arXiv:1805.01712, 2018
12018
Picometer-precision few-tilt ptychotomography of 2D materials
C Hofer, K Mustonen, V Skákalová, TJ Pennycook
2D Materials 10 (3), 035029, 2023
2023
The system can't perform the operation now. Try again later.
Articles 1–20