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Ken Uchida
Ken Uchida
Verified email at material.t.u-tokyo.ac.jp - Homepage
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Year
Solution for high-performance Schottky-source/drain MOSFETs: Schottky barrier height engineering with dopant segregation technique
A Kinoshita, Y Tsuchiya, A Yagishita, K Uchida, J Koga
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004., 168-169, 2004
4152004
High-performance 50-nm-gate-length Schottky-source/drain MOSFETs with dopant-segregation junctions
A Kinoshita, C Tanaka, K Uchida, J Koga
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005., 158-159, 2005
3392005
Experimental study on carrier transport mechanism in ultrathin-body SOI nand p-MOSFETs with SOI thickness less than 5 nm
K Uchida, H Watanabe, A Kinoshita, J Koga, T Numata, S Takagi
Digest. International Electron Devices Meeting,, 47-50, 2002
3292002
Comprehensive study on injection velocity enhancement in dopant-segregated Schottky MOSFETs
A Kinoshita, T Kinoshita, Y Nishi, K Uchida, S Toriyama, R Hasumi, ...
2006 International Electron Devices Meeting, 1-4, 2006
2682006
Physical mechanisms of electron mobility enhancement in uniaxial stressed MOSFETs and impact of uniaxial stress engineering in ballistic regime
K Uchida, T Krishnamohan, KC Saraswat, Y Nishi
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest …, 2005
2412005
Carrier scattering induced by thickness fluctuation of silicon-on-insulator film in ultrathin-body metal–oxide–semiconductor field-effect transistors
K Uchida, S Takagi
Applied Physics Letters 82 (17), 2916-2918, 2003
1942003
Nonvolatile Si quantum memory with self-aligned doubly-stacked dots
R Ohba, N Sugiyama, K Uchida, J Koga, A Toriumi
IEEE Transactions on Electron Devices 49 (8), 1392-1398, 2002
1892002
High-mobility ultrathin strained Ge MOSFETs on bulk and SOI with low band-to-band tunneling leakage: Experiments
T Krishnamohan, Z Krivokapic, K Uchida, Y Nishi, KC Saraswat
IEEE Transactions on Electron Devices 53 (5), 990-999, 2006
1702006
Analytical single-electron transistor (SET) model for design and analysis of realistic SET circuits
KUK Uchida, KMK Matsuzawa, JKJ Koga, ROR Ohba, STS Takagi, ...
Japanese Journal of Applied Physics 39 (4S), 2321, 2000
1632000
A unified simulation of Schottky and ohmic contacts
K Matsuzawa, K Uchida, A Nishiyama
IEEE Transactions on Electron Devices 47 (1), 103-108, 2000
1622000
Programmable single-electron transistor logic for future low-power intelligent LSI: proposal and room-temperature operation
K Uchida, J Koga, R Ohba, A Toriumi
IEEE Transactions on Electron Devices 50 (7), 1623-1630, 2003
1562003
Experimental study on carrier transport mechanisms in double-and single-gate ultrathin-body MOSFETs-Coulomb scattering, volume inversion, and/spl delta/T/sub SOI/-induced …
K Uchida, J Koga, S Takagi
IEEE International Electron Devices Meeting 2003, 33.5. 1-33.5. 4, 2003
1462003
Experimental evidences of quantum-mechanical effects on low-field mobility, gate-channel capacitance, and threshold voltage of ultrathin body SOI MOSFETs
K Uchida, J Koga, R Ohba, T Numata, SI Takagi
International Electron Devices Meeting. Technical Digest (Cat. No. 01CH37224 …, 2001
1122001
Experimental study of biaxial and uniaxial strain effects on carrier mobility in bulk and ultrathin-body SOI MOSFETs
K Uchida, R Zednik, CH Lu, H Jagannathan, J McVittie, PC McIntyre, ...
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 …, 2004
1102004
Experimental study on electron mobility in ultrathin-body silicon-on-insulator metal-oxide-semiconductor field-effect transistors
K Uchida, J Koga, S Takagi
Journal of Applied Physics 102 (7), 2007
1082007
Sub-band structure engineering for advanced CMOS channels
S Takagi, T Mizuno, T Tezuka, N Sugiyama, S Nakaharai, T Numata, ...
Solid-State Electronics 49 (5), 684-694, 2005
1002005
Nanoscale Thermal Management of Single SnO2 Nanowire: pico-Joule Energy Consumed Molecule Sensor
G Meng, F Zhuge, K Nagashima, A Nakao, M Kanai, Y He, M Boudot, ...
ACS sensors 1 (8), 997-1002, 2016
802016
Magnetic field dependence of Pauli spin blockade: A window into the sources of spin relaxation in silicon quantum dots
G Yamahata, T Kodera, HOH Churchill, K Uchida, CM Marcus, S Oda
Physical Review B—Condensed Matter and Materials Physics 86 (11), 115322, 2012
792012
Enhancement of hot-electron generation rate in Schottky source metal–oxide–semiconductor field-effect transistors
K Uchida, K Matsuzawa, J Koga, S Takagi, A Toriumi
Applied Physics Letters 76 (26), 3992-3994, 2000
702000
Semiconductor device and manufacturing method of same
M Saitoh, K Uchida
US Patent 8,076,231, 2011
692011
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