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Co-authors
- Byoungho LeeSeoul National University, Professor of School of Electrical and Computer EngineeringVerified email at snu.ac.kr
- Gun-Yeal LeeStanford UniversityVerified email at stanford.edu
- Seung-Yeol LeeAssistant Professor, School of Electronics Engineering, Kyungpook National UniversityVerified email at knu.ac.kr
- Joonsoo KimElectronics and Telecommunications Research InstituteVerified email at etri.re.kr
- Jongwoo HongStaff Engineer, Samsung ElectronicsVerified email at samsung.com
- Yohan LeeChair in Hybrid Nanosystems, Ludwig-Maximilians-Universität MünchenVerified email at physik.uni-muenchen.de
- Jeong-Geun YunSamsung ElectronicsVerified email at samsung.com
- Sang-Eun MunSeoul National UniversityVerified email at snu.ac.kr
- Hyeonsoo ParkSamsung Advanced Institute of Technology, Samsung electronicsVerified email at samsung.com
- Sun-Je KimSoongsil University, School of Electrical EngineeringVerified email at ssu.ac.kr
- Jangwoon SungPostdoctoral Scholar, Brookhaven National LaboratoryVerified email at bnl.gov
- Taerin ChungThe State University of New Jersey, RutgersVerified email at rutgers.edu