Profiles

Stefano Bonaldo

University of Padova

Verified email at dei.unipd.it

Cited by 711

Biosensors radiation effects on electronics reliability of electronics TID semiconductor devices

Dipjyoti Das

National Institute of Technology Silchar

Verified email at ei.nits.ac.in

Cited by 66

Process Control 2DOF PID Control Fractional Controller TID Time delayed processes

Pierre Kohler

3D PLUS

Verified email at 3d-plus.com

Cited by 37

Electronique radiation SEE TID TNID

Pritam Yogi

Dy. Technical Officer,Dept. of Electrical Engineering, IIT Delhi

Verified email at ee.iitd.ac.in

Cited by 15

CMOS Fabrication Device Characterization HCI TID

Zachary R Brumbach

Georgia Institute of Technology

Verified email at gatech.edu

Cited by 13

SiGe HBTs Radiation Effects TCAD SEE TID

Semih Ramazanoglu

PhD Candidate, Research Assistant at Institute of Electronics(IFE), Graz University of …

Verified email at tugraz.at

Cited by 10

UWB Integrated Circuits RTN Total Ionizing Dose TID

Khairul Sham

Verified email at siswa.upsi.edu.my

Cited by 7

Testing in Sports Science TID

Zaid Ghazali

Centre Head for TID, National Sports Institute of Malaysia

Verified email at isn.gov.my

Cited by 5

Talent ID Talent Development TID Active Living

Ingunn Landro Sandset

Master barnehagepedagogikk, Høgskolen i Oslo

Verified email at online.no

Cited by 1

Tid Kvalitet barnehage filosofi etikk

Uzm. Ufuk ÇELEBİOĞLU

Muğla Sıtkı Koçman Üniversitesi

Verified email at aile.gov.tr

Cited by 1

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