Youngbin Lee

Youngbin Lee

Korea Electronics Technology Institute
Verified email at keti.re.kr
Cited by 17473
Semiconductor reliability Device characterization Nanomaterials
Tian Shen

Tian Shen

Apple
Verified email at apple.com
Cited by 3406
Semiconductor Reliability condensed matter physics Graphene
Biswajit Ray

Biswajit Ray

Colorado State University
Verified email at colostate.edu
Cited by 1821
Semiconductor Reliability 3D NAND Storage System Radiation Effects Hardware Security
Natarajan Iyer

Natarajan Iyer

ALLEGRO MICROSYSTEMS
Verified email at ALLEGROMICRO.COM
Cited by 1425
Electrostatic Discharge Semiconductor Reliability Failure analysis
Wardhana Sasangka

Wardhana Sasangka

Meta
Verified email at fb.com
Cited by 1406
Semiconductor Reliability Failure Analysis Electron Microscopy Materials Science
Dhruv Singh

Dhruv Singh

Purdue University, Intel Corporation, GlobalFoundries
Verified email at globalfoundries.com
Cited by 1129
nanoscale thermal transport numerical methods in engineering semiconductor reliability
Narendra Shiradkar, PhD

Narendra Shiradkar, PhD

Associate Professor, Electrical Engineering, Indian Institute of Technology Bombay
Verified email at ee.iitb.ac.in
Cited by 899
Photovoltaic Module Reliability Semiconductor Reliability Failure Analysis Predictive Analytics
Ang Feng

Ang Feng

Institute for Microelectronics, TU Wien, Austria
Verified email at ugent.be
Cited by 757
semiconductor reliability mechanoluminescence
Nathan Jack

Nathan Jack

Intel Corp.
Verified email at intel.com
Cited by 514
Electrostatic discharge semiconductor reliability
Young Suh Song

Young Suh Song

PhD Student in Electrical Engineering, Stanford University
Verified email at stanford.edu
Cited by 435
semiconductor devices semiconductor reliability 2D materials thermal management nanofabrication
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