Eunha Lee

Eunha Lee

SAIT (Samsung Advanced Institute of Technology), Samsung Electronics
Verified email at samsung.com
Cited by 10424
Microscopy & spectroscopy electron tomography 2D material high-k dielectric oxide TFT
Ning Fang

Ning Fang

Xiamen University
Cited by 4812
Analytical/Physical Chemistry Microscopy & Spectroscopy Biophysics Single Molecule Catalysis
Zheng Ren

Zheng Ren

Intel Corporation, University of Connecticut
Verified email at uconn.edu
Cited by 3403
Materials Engineering Nanotechnology Microscopy & Spectroscopy Surface Science
Peng Zhang

Peng Zhang

Politecnico di Torino
Verified email at polito.it
Cited by 954
Analytical Chemistry and Instruments Microscopy & Spectroscopy Nanofabrication Surface Force
Mostak Ahmed

Mostak Ahmed

Device Processing Engineer
Verified email at unsw.edu.au
Cited by 317
Nano/Microfabrication Biosensing & Molecular Biology Electrochemical Methods Microscopy & Spectroscopy
Amrit Laudari

Amrit Laudari

University of North Dakota
Verified email at und.edu
Cited by 272
Condensed matter Physics Ultra High Vacuum Microscopy & Spectroscopy Materials Science Organic Electronics
Sameera Pathiranage

Sameera Pathiranage

North Carolina State University
Verified email at ncsu.edu
Cited by 99
Condensed matter Physics Surfaces and Interfaces Ultra High Vacuum Microscopy & Spectroscopy