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Damien Faurie
LSPM - CNRS, Université Sorbonne Paris Nord
Verified email at univ-paris13.fr
Cited by 1551
Mechanical behavior of thin films
Synchrotron X-ray diffraction
Bibhu Prasad Sahu
Postdoctoral Research Fellow, University of Michigan
Verified email at umich.edu
Cited by 289
Microstructural characterization
Mechanical behavior of thin films
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