Jacopo Franco

Jacopo Franco

imec
Verified email at imec.be
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CMOS devices reliability Bias Temperature Instability variability high mobility channels
Diing Shenp ANG

Diing Shenp ANG

Nanyang Technological University, Singapore
Verified email at ntu.edu.sg
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Franz Schanovsky

Franz Schanovsky

Global TCAD Solutions GmbH
Verified email at chello.at
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Semiconductor Device Modeling Reliability Bias Temperature Instability SONOS Charge Trapping Layer
Arunkumar Vijayan

Arunkumar Vijayan

Postdoctoral Researcher, Karlsruhe Institute of Technology
Verified email at kit.edu
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Machine Learning Soft Errors Bias Temperature Instability