Loading...
The system can't perform the operation now. Try again later.
Articles
Case law
Profiles
My profile
My library
Metrics
Alerts
Settings
Get journal articles
Get journal articles
Profiles
My profile
My library
Hao-Chiao Hong
National Yang Ming Chiao Tung University
Verified email at nycu.edu.tw
Cited by 877
analog test
design-for-testability
BIST
Nektar Xama
Micas - ESAT - KULeuven
Verified email at esat.kuleuven.be
Cited by 101
Integrated Circuits
Analog Test
Automatic Test Generation
Mona Ganji
PhD student, Iowa State University
Verified email at iastate.edu
Cited by 75
Analog and Mixed signal Design
Analog and Mixed signal Functional Safety
Sensor Design
IC structural Test
Analog Test
Privacy
Terms
Help
About Scholar
Search help