DC triode sputtered zinc oxide surface elastic wave transducers FS Hickernell Journal of Applied Physics 44 (3), 1061-1071, 1973 | 212 | 1973 |
Method of making a monolithic thin film resonator lattice filter L Mang, FS Hickernell, RG Kinsman US Patent 5,692,279, 1997 | 189 | 1997 |
Zinc oxide films for acoustoelectric device applications FS Hickernell IEEE Transactions on Sonics and Ultrasonics 32 (5), 621-629, 1985 | 165 | 1985 |
Zinc-oxide thin-film surface-wave transducers FS Hickernell Proceedings of the IEEE 64 (5), 631-635, 1976 | 162 | 1976 |
The piezoelectric semiconductor and acoustoelectronic device development in the sixties FS Hickernell IEEE transactions on ultrasonics, ferroelectrics, and frequency control 52 …, 2005 | 109 | 2005 |
Elastic Constants of Single‐Crystal Indium Phosphide FS Hickernell, WR Gayton Journal of Applied Physics 37 (1), 462-462, 1966 | 98 | 1966 |
The experimental and theoretical characterization of the SAW propagation properties for zinc oxide films on silicon carbide IS Didenko, FS Hickernell, NF Naumenko IEEE transactions on ultrasonics, ferroelectrics, and frequency control 47 …, 2000 | 95 | 2000 |
Radio frequency sputter deposited boron nitride films MD Wiggins, CR Aita, FS Hickernell Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 2 (2 …, 1984 | 94 | 1984 |
Optical waveguide including superstrate of niobium or silicon oxynitride and method of making same FV Richard, FS Hickernell, FY Cho US Patent 4,701,008, 1987 | 88 | 1987 |
Scattering loss reduction in ZnO optical waveguides by laser annealing S Dutta, HE Jackson, JT Boyd, FS Hickernell, RL Davis Applied Physics Letters 39 (3), 206-208, 1981 | 82 | 1981 |
Method for making optical channel waveguides and product manufactured thereby FY Cho, FS Hickernell, FV Richard US Patent 4,652,290, 1987 | 75 | 1987 |
The characterization of sputtered polycrystalline aluminum nitride on silicon by surface acoustic wave measurements HM Liaw, FS Hickernell IEEE transactions on ultrasonics, ferroelectrics, and frequency control 42 …, 1995 | 68 | 1995 |
Comparative study of the elastic properties of polycrystalline aluminum nitride films on silicon by Brillouin light scattering G Carlotti, G Gubbiotti, FS Hickernell, HM Liaw, G Socino Thin Solid Films 310 (1-2), 34-38, 1997 | 56 | 1997 |
Acoustoelectronics: History, present state, and new ideas for a new era YV Gulyaev, FS Hickernell IEEE Ultrasonics Symposium, 2004 1, 182-190, 2004 | 53 | 2004 |
CO2laser annealing of Si3N4, Nb2O5, and Ta2O5thin-film optical waveguides to achieve scattering loss reduction S Dutta, H Jackson, J Boyd, R Davis, F Hickernell IEEE Journal of Quantum Electronics 18 (4), 800-806, 2003 | 53 | 2003 |
The elastic constants of sputtered aluminum nitride films G Carlotti, FS Hickernell, HM Liaw, L Palmieri, G Socino, E Verona 1995 IEEE Ultrasonics Symposium. Proceedings. An International Symposium 1 …, 1995 | 52 | 1995 |
ZnO processing for bulk-and surface-wave devices FS Hickernell 1980 Ultrasonics Symposium, 785-794, 1980 | 52 | 1980 |
The elastic properties of thin-film silicon nitride TS Hickernell, FM Fliegel, FS Hickernell IEEE Symposium on Ultrasonics, 445-448, 1990 | 51 | 1990 |
Microstructure of ZnO films used for acoustic surface‐wave generation FS Hickernell Journal of Vacuum Science and Technology 12 (4), 879-883, 1975 | 48 | 1975 |
Effects of deposition parameters on optical loss for rf‐sputtered Ta2O5 and Si3N4 waveguides WM Paulson, FS Hickernell, RL Davis Journal of Vacuum Science and Technology 16 (2), 307-310, 1979 | 45 | 1979 |