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Fred S Hickernell
Fred S Hickernell
Motorola
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Zitiert von
Zitiert von
Jahr
DC triode sputtered zinc oxide surface elastic wave transducers
FS Hickernell
Journal of Applied Physics 44 (3), 1061-1071, 1973
2121973
Method of making a monolithic thin film resonator lattice filter
L Mang, FS Hickernell, RG Kinsman
US Patent 5,692,279, 1997
1891997
Zinc oxide films for acoustoelectric device applications
FS Hickernell
IEEE Transactions on Sonics and Ultrasonics 32 (5), 621-629, 1985
1651985
Zinc-oxide thin-film surface-wave transducers
FS Hickernell
Proceedings of the IEEE 64 (5), 631-635, 1976
1621976
The piezoelectric semiconductor and acoustoelectronic device development in the sixties
FS Hickernell
IEEE transactions on ultrasonics, ferroelectrics, and frequency control 52 …, 2005
1092005
Elastic Constants of Single‐Crystal Indium Phosphide
FS Hickernell, WR Gayton
Journal of Applied Physics 37 (1), 462-462, 1966
981966
The experimental and theoretical characterization of the SAW propagation properties for zinc oxide films on silicon carbide
IS Didenko, FS Hickernell, NF Naumenko
IEEE transactions on ultrasonics, ferroelectrics, and frequency control 47 …, 2000
952000
Radio frequency sputter deposited boron nitride films
MD Wiggins, CR Aita, FS Hickernell
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 2 (2 …, 1984
941984
Optical waveguide including superstrate of niobium or silicon oxynitride and method of making same
FV Richard, FS Hickernell, FY Cho
US Patent 4,701,008, 1987
881987
Scattering loss reduction in ZnO optical waveguides by laser annealing
S Dutta, HE Jackson, JT Boyd, FS Hickernell, RL Davis
Applied Physics Letters 39 (3), 206-208, 1981
821981
Method for making optical channel waveguides and product manufactured thereby
FY Cho, FS Hickernell, FV Richard
US Patent 4,652,290, 1987
751987
The characterization of sputtered polycrystalline aluminum nitride on silicon by surface acoustic wave measurements
HM Liaw, FS Hickernell
IEEE transactions on ultrasonics, ferroelectrics, and frequency control 42 …, 1995
681995
Comparative study of the elastic properties of polycrystalline aluminum nitride films on silicon by Brillouin light scattering
G Carlotti, G Gubbiotti, FS Hickernell, HM Liaw, G Socino
Thin Solid Films 310 (1-2), 34-38, 1997
561997
Acoustoelectronics: History, present state, and new ideas for a new era
YV Gulyaev, FS Hickernell
IEEE Ultrasonics Symposium, 2004 1, 182-190, 2004
532004
CO2laser annealing of Si3N4, Nb2O5, and Ta2O5thin-film optical waveguides to achieve scattering loss reduction
S Dutta, H Jackson, J Boyd, R Davis, F Hickernell
IEEE Journal of Quantum Electronics 18 (4), 800-806, 2003
532003
The elastic constants of sputtered aluminum nitride films
G Carlotti, FS Hickernell, HM Liaw, L Palmieri, G Socino, E Verona
1995 IEEE Ultrasonics Symposium. Proceedings. An International Symposium 1 …, 1995
521995
ZnO processing for bulk-and surface-wave devices
FS Hickernell
1980 Ultrasonics Symposium, 785-794, 1980
521980
The elastic properties of thin-film silicon nitride
TS Hickernell, FM Fliegel, FS Hickernell
IEEE Symposium on Ultrasonics, 445-448, 1990
511990
Microstructure of ZnO films used for acoustic surface‐wave generation
FS Hickernell
Journal of Vacuum Science and Technology 12 (4), 879-883, 1975
481975
Effects of deposition parameters on optical loss for rf‐sputtered Ta2O5 and Si3N4 waveguides
WM Paulson, FS Hickernell, RL Davis
Journal of Vacuum Science and Technology 16 (2), 307-310, 1979
451979
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