Folgen
Shao Qi Lim
Shao Qi Lim
Postdoctoral Research Fellow, The University of Melbourne
Bestätigte E-Mail-Adresse bei unimelb.edu.au - Startseite
Titel
Zitiert von
Zitiert von
Jahr
Observation of enhanced infrared absorption in silicon supersaturated with gold by pulsed laser melting of nanometer-thick gold films
PK Chow, W Yang, Q Hudspeth, SQ Lim, JS Williams, JM Warrender
Journal of Applied Physics 123 (13), 2018
292018
Toward understanding and optimizing Au-hyperdoped Si infrared photodetectors
SQ Lim, CTK Lew, PK Chow, JM Warrender, JS Williams, BC Johnson
APL Materials 8 (6), 2020
222020
Electrical and optical doping of silicon by pulsed-laser melting
SQ Lim, JS Williams
Micro 2 (1), 1-22, 2021
202021
A critical evaluation of Ag-and Ti-hyperdoped Si for Si-based infrared light detection
SQ Lim, AJ Akey, E Napolitani, PK Chow, JM Warrender, JS Williams
Journal of Applied Physics 129 (6), 2021
202021
Process-induced defects in Au-hyperdoped Si photodiodes
SQ Lim, CTK Lew, PK Chow, JM Warrender, JS Williams, BC Johnson
Journal of Applied Physics 126 (22), 2019
182019
An integrated widefield probe for practical diamond nitrogen-vacancy microscopy
GJ Abrahams, SC Scholten, AJ Healey, IO Robertson, N Dontschuk, ...
Applied Physics Letters 119 (25), 2021
122021
Sub-bandgap photoresponse and leakage current analysis in gold thin film-hyperdoped silicon photodiodes
PK Chow, SQ Lim, JS Williams, JM Warrender
Semiconductor Science and Technology 37 (12), 124002, 2022
62022
Carrier lifetimes in gold–hyperdoped silicon—Influence of dopant incorporation methods and concentration profiles
SS Dissanayake, NO Pallat, PK Chow, SQ Lim, Y Liu, Q Yue, R Fiutak, ...
APL Materials 10 (11), 2022
62022
Millisecond electron spin coherence time for erbium ions in silicon
IR Berkman, A Lyasota, GG de Boo, JG Bartholomew, SQ Lim, ...
arXiv preprint arXiv:2307.10021, 2023
52023
High-resolution Rutherford backscattering spectrometry with an optimised solid-state detector
SG Robson, AM Jakob, D Holmes, SQ Lim, BC Johnson, DN Jamieson
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2020
52020
Remote plasma-enhanced chemical vapor deposition of GeSn on Si: Material and defect characterization
SQ Lim, LQ Huston, LA Smillie, GJ Grzybowski, X Huang, JS Williams, ...
Journal of Applied Physics 133 (23), 2023
42023
Impact of ion implantation and laser processing parameters on carrier lifetimes in gold-hyperdoped silicon
SS Dissanayake, PK Chow, SQ Lim, W Yang, R Fiutak, JS Williams, ...
Semiconductor Science and Technology 38 (2), 024003, 2023
42023
Graphene‐Enhanced Single Ion Detectors for Deterministic Near‐Surface Dopant Implantation in Diamond
NFL Collins, AM Jakob, SG Robson, SQ Lim, P Räcke, BC Johnson, B Liu, ...
Advanced Functional Materials 33 (51), 2306601, 2023
32023
Optical hyperdoping
W Yang, SQ Lim, JS Williams
Laser Annealing Processes in Semiconductor Technology, 323-356, 2021
32021
Room temperature electrical characteristics of gold-hyperdoped silicon
SQ Lim, JM Warrender, C Notthoff, T Ratcliff, JS Williams, BC Johnson
Journal of Applied Physics 135 (9), 2024
22024
Cellular breakdown and carrier lifetimes in gold-hyperdoped silicon
QM Hudspeth, M Altwerger, PK Chow, MJ Sher, SS Dissanayake, W Yang, ...
Semiconductor Science and Technology 37 (12), 124003, 2022
22022
Defects in transition-metal-hyperdoped si and their role in near-infrared light detection
SQ Lim
PQDT-Global, 2021
22021
Evaluating carrier lifetimes in laser hyperdoped silicon using terahertz spectroscopy
S Dissanayake, P Chow, SQ Lim, M Wilkins, E Dumitresc, W Yang, ...
CLEO: QELS_Fundamental Science, JTu3O. 6, 2018
12018
Strong coupling of a superconducting flux qubit to single bismuth donors
T Chang, I Holzman, SQ Lim, D Holmes, BC Johnson, DN Jamieson, ...
arXiv preprint arXiv:2411.02852, 2024
2024
Comparison of GeSn alloy films prepared by ion implantation and remote plasma-enhanced chemical vapor deposition methods
X Huang, SQ Lim, T Ratcliff, LA Smillie, GJ Grzybowski, BB Claflin, ...
Journal of Vacuum Science & Technology B 42 (4), 2024
2024
Das System kann den Vorgang jetzt nicht ausführen. Versuchen Sie es später erneut.
Artikel 1–20