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Ferdinando Iucolano
Ferdinando Iucolano
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Zitiert von
Jahr
Emerging trends in wide band gap semiconductors (SiC and GaN) technology for power devices
F Roccaforte, P Fiorenza, G Greco, RL Nigro, F Giannazzo, F Iucolano, ...
Microelectronic Engineering 187, 66-77, 2018
4822018
Ohmic contacts to Gallium Nitride materials
G Greco, F Iucolano, F Roccaforte
Applied Surface Science 383, 324-345, 2016
3342016
An overview of normally-off GaN-based high electron mobility transistors
F Roccaforte, G Greco, P Fiorenza, F Iucolano
Materials 12 (10), 1599, 2019
2802019
Review of technology for normally-off HEMTs with p-GaN gate
G Greco, F Iucolano, F Roccaforte
Materials Science in Semiconductor Processing 78, 96-106, 2018
2742018
Barrier inhomogeneity and electrical properties of Pt∕ GaN Schottky contacts
F Iucolano, F Roccaforte, F Giannazzo, V Raineri
Journal of Applied Physics 102 (11), 2007
1932007
Surface and interface issues in wide band gap semiconductor electronics
F Roccaforte, F Giannazzo, F Iucolano, J Eriksson, MH Weng, V Raineri
Applied Surface Science 256 (19), 5727-5735, 2010
1252010
Temperature dependence of the specific resistance in Ti∕ Al∕ Ni∕ Au contacts on n-type GaN
F Iucolano, F Roccaforte, A Alberti, C Bongiorno, S Di Franco, V Raineri
Journal of applied physics 100 (12), 2006
1142006
Experimental and numerical analysis of hole emission process from carbon-related traps in GaN buffer layers
A Chini, G Meneghesso, M Meneghini, F Fantini, G Verzellesi, A Patti, ...
IEEE Transactions on Electron Devices 63 (9), 3473-3478, 2016
982016
Nanoscale carrier transport in Ti∕ Al∕ Ni∕ Au Ohmic contacts on AlGaN epilayers grown on Si (111)
F Roccaforte, F Iucolano, F Giannazzo, A Alberti, V Raineri
Applied physics letters 89 (2), 2006
902006
Effects of annealing treatments on the properties of Al/Ti/p-GaN interfaces for normally OFF p-GaN HEMTs
G Greco, F Iucolano, S Di Franco, C Bongiorno, A Patti, F Roccaforte
IEEE Transactions on Electron Devices 63 (7), 2735-2741, 2016
752016
Correlation between microstructure and temperature dependent electrical behavior of annealed Ti/Al/Ni/Au Ohmic contacts to AlGaN/GaN heterostructures
F Iucolano, G Greco, F Roccaforte
Applied Physics Letters 103 (20), 2013
742013
Temperature behavior of inhomogeneous Pt∕ GaN Schottky contacts
F Iucolano, F Roccaforte, F Giannazzo, V Raineri
Applied Physics Letters 90 (9), 2007
722007
GaN-on-Si HEMTs for wireless base stations
F Iucolano, T Boles
Materials Science in Semiconductor Processing 98, 100-105, 2019
552019
Influence of high-temperature GaN annealed surface on the electrical properties of Ni/GaN Schottky contacts
F Iucolano, F Roccaforte, F Giannazzo, V Raineri
Journal of Applied Physics 104 (9), 2008
532008
Channel Mobility in GaN Hybrid MOS-HEMT Using SiO2as Gate Insulator
P Fiorenza, G Greco, F Iucolano, A Patti, F Roccaforte
IEEE Transactions on Electron Devices 64 (7), 2893-2899, 2017
502017
Nanoscale current transport through Schottky contacts on wide bandgap semiconductors
F Giannazzo, F Roccaforte, F Iucolano, V Raineri, F Ruffino, MG Grimaldi
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009
462009
Nanoscale structural and electrical evolution of Ta-and Ti-based contacts on AlGaN/GaN heterostructures
G Greco, F Giannazzo, F Iucolano, R Lo Nigro, F Roccaforte
Journal of Applied Physics 114 (8), 2013
432013
Electrical behavior of AlGaN/GaN heterostuctures upon high-temperature selective oxidation
F Roccaforte, F Giannazzo, F Iucolano, C Bongiorno, V Raineri
Journal of Applied Physics 106 (2), 2009
412009
High-performance graphene/AlGaN/GaN Schottky junctions for hot electron transistors
F Giannazzo, G Greco, E Schilirò, R Lo Nigro, I Deretzis, A La Magna, ...
ACS Applied Electronic Materials 1 (11), 2342-2354, 2019
402019
On recoverable behavior of PBTI in AlGaN/GaN MOS-HEMT
E Acurio, F Crupi, P Magnone, L Trojman, G Meneghesso, F Iucolano
Solid-State Electronics 132, 49-56, 2017
402017
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