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Hsuan-Ping Lee
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Investigation of AlGaN/GaN high electron mobility transistor structures on 200-mm silicon (111) substrates employing different buffer layer configurations
HP Lee, J Perozek, LD Rosario, C Bayram
Scientific Reports 6, 37588, 2016
1292016
Reconfigurable liquid-core/liquid-cladding optical waveguides with dielectrophoresis-driven virtual microchannels on an electromicrofluidic platform
SK Fan, HP Lee, CC Chien, YW Lu, Y Chiu, FY Lin
Lab on a Chip 16 (5), 847-854, 2016
292016
Improving current ON/OFF ratio and subthreshold swing of Schottky-gate AlGaN/GaN HEMTs by postmetallization annealing
HP Lee, C Bayram
IEEE Transactions on Electron Devices 67 (7), 2760-2764, 2020
232020
Systematic study of shockley-read-hall and radiative recombination in GaN on Al2O3, freestanding GaN, and GaN on Si
J Meyer, R Liu, RD Schaller, HP Lee, C Bayram
Journal of Physics: Photonics 2 (3), 035003, 2020
182020
Investigation of structural, optical, and electrical characteristics of an AlGaN/GaN high electron mobility transistor structure across a 200 mm Si(1 1 1) substrate
J Perozek, HP Lee, B Krishnan, A Paranjpe, KB Reuter, DK Sadana, ...
Journal of Physics D: Applied Physics 50 (5), 055103, 2017
152017
Investigation of annealed, thin (∼ 2.6 nm)-Al2O3/AlGaN/GaN metal-insulator-semiconductor heterostructures on Si (111) via capacitance-voltage and current-voltage studies
HP Lee, C Bayram
Materials Research Express 6 (10), 105904, 2019
112019
Investigation of annealed, thin (similar to 2.6 nm)-Al2O3/AlGaN/GaN metal-insulator-semiconductor heterostructures on Si (111) via capacitance-voltage and current-voltage studies
HP Lee, C Bayram
MATERIALS RESEARCH EXPRESS 6 (10), 2019
22019
Scaling AlGaN/GaN high electron mobility transistor structures onto 200-mm silicon (111) substrates through novel buffer layer configurations
HP Lee, J Perozek, C Bayram
International Conference on Compound Semiconductor Manufacturing Technology …, 2017
22017
Diamond Power Electronics: From 1kV towards 10kV Breakdown Voltage
Z Han, HP Lee, B Bayram, C Bayram
2022 Compound Semiconductor Week (CSW), 1-2, 2022
12022
Improvement in electron-beam lithography throughput by exploiting relaxed patterning fidelity requirements with directed self-assembly
HY Yu, CH Liu, YT Shen, HP Lee, KY Tsai
Alternative Lithographic Technologies VI 9049, 499-511, 2014
12014
Atomic layer deposition Al2O3-passivated AlGaN/GaN high-electron-mobility transistors on Si (111) towards reliable high-speed electronics
HP Lee
University of Illinois at Urbana-Champaign, 2020
2020
Design of an electron-optical system with a ball-tip emission source through a numerical optimization method for high-throughput electron-beam–direct-write lithography
HP Lee, SY Chen, CH Liu, Q Ding, YT Shen, KY Tsai
Japanese Journal of Applied Physics 54 (6S1), 06FD01, 2015
2015
Direct-scatterometry-enabled PEC model calibration with two-dimensional layouts
YY Yang, HP Lee, CH Liu, HY Yu, KY Tsai, JH Li
Metrology, Inspection, and Process Control for Microlithography XXVIII 9050 …, 2014
2014
多重電子束直寫微影中具球形結構場發射源之電子光學系統設計與最佳化
李宣屏
2013
Supplementary Online Material for:“Investigation of AlGaN/GaN high electron mobility transistor structures on 200-mm silicon (111) substrates employing different buffer layer …
HP Lee, J Perozek, LD Rosario, C Bayram
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