| Heavy Alkali Treatment of Cu(In,Ga)Se2 Solar Cells: Surface versus Bulk Effects S Siebentritt, E Avancini, M Bär, J Bombsch, E Bourgeois, S Buecheler, ... Advanced Energy Materials 10 (8), 1903752, 2020 | 151 | 2020 |
| Clustering and nearest neighbour distances in atom-probe tomography T Philippe, F De Geuser, S Duguay, W Lefebvre, O Cojocaru-Mirédin, ... Ultramicroscopy 109 (10), 1304-1309, 2009 | 138 | 2009 |
| Advance in multi-hit detection and quantization in atom probe tomography GD Costa, H Wang, S Duguay, A Bostel, D Blavette, B Deconihout Review of Scientific Instruments 83 (12), 2012 | 104 | 2012 |
| Depth resolution function of the laser assisted tomographic atom probe in the investigation of semiconductors E Cadel, F Vurpillot, R Lardé, S Duguay, B Deconihout Journal of Applied Physics 106 (4), 2009 | 91 | 2009 |
| Rubidium distribution at atomic scale in high efficient Cu (In, Ga) Se2 thin-film solar cells A Vilalta-Clemente, M Raghuwanshi, S Duguay, C Castro, E Cadel, ... Applied Physics Letters 112 (10), 2018 | 82 | 2018 |
| Structural and electrical properties of Ge nanocrystals embedded in SiO2 by ion implantation and annealing S Duguay, JJ Grob, A Slaoui, Y Le Gall, M Amann-Liess Journal of applied physics 97 (10), 2005 | 75 | 2005 |
| 3D analysis of advanced nano-devices using electron and atom probe tomography A Grenier, S Duguay, JP Barnes, R Serra, G Haberfehlner, D Cooper, ... Ultramicroscopy 136, 185-192, 2014 | 71 | 2014 |
| Direct imaging of boron segregation to extended defects in silicon S Duguay, T Philippe, F Cristiano, D Blavette Applied Physics Letters 97 (24), 2010 | 60 | 2010 |
| Influence of RbF post deposition treatment on heterojunction and grain boundaries in high efficient (21.1%) Cu (In, Ga) Se2 solar cells M Raghuwanshi, A Vilalta-Clemente, C Castro, S Duguay, E Cadel, ... Nano Energy 60, 103-110, 2019 | 59 | 2019 |
| Efficient n-type doping of Si nanocrystals embedded in SiO2 by ion beam synthesis R Khelifi, D Mathiot, R Gupta, D Muller, M Roussel, S Duguay Applied Physics Letters 102 (1), 2013 | 58 | 2013 |
| Extended defects formation in nanosecond laser-annealed ion implanted silicon Y Qiu, F Cristiano, K Huet, F Mazzamuto, G Fisicaro, A La Magna, ... Nano letters 14 (4), 1769-1775, 2014 | 52 | 2014 |
| Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques A Grenier, S Duguay, JP Barnes, R Serra, N Rolland, G Audoit, P Morin, ... Applied Physics Letters 106 (21), 2015 | 49 | 2015 |
| Influence of grain boundary modification on limited performance of wide bandgap Cu (In, Ga) Se2 solar cells M Raghuwanshi, E Cadel, P Pareige, S Duguay, F Couzinie-Devy, L Arzel, ... Applied Physics Letters 105 (1), 2014 | 48 | 2014 |
| A meshless algorithm to model field evaporation in atom probe tomography N Rolland, F Vurpillot, S Duguay, D Blavette Microscopy and Microanalysis 21 (6), 1649-1656, 2015 | 36 | 2015 |
| Clustering and pair correlation function in atom probe tomography T Philippe, S Duguay, D Blavette Ultramicroscopy 110 (7), 862-865, 2010 | 35 | 2010 |
| Atomic-scale redistribution of dopants in polycrystalline silicon layers S Duguay, A Colin, D Mathiot, P Morin, D Blavette Journal of Applied Physics 108 (3), 2010 | 34 | 2010 |
| Influence of Na on grain boundary and properties of Cu(In,Ga)Se2 solar cells M Raghuwanshi, E Cadel, S Duguay, L Arzel, N Barreau, P Pareige Progress in Photovoltaics: Research and Applications 25 (5), 367-375, 2017 | 32 | 2017 |
| An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials N Rolland, DJ Larson, BP Geiser, S Duguay, F Vurpillot, D Blavette Ultramicroscopy 159, 195-201, 2015 | 31 | 2015 |
| Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives JP Barnes, A Grenier, I Mouton, S Barraud, G Audoit, J Bogdanowicz, ... Scripta Materialia 148, 91-97, 2018 | 28 | 2018 |
| Atom probe tomography in nanoelectronics D Blavette, S Duguay The European Physical Journal-Applied Physics 68 (1), 10101, 2014 | 27 | 2014 |
Didier BlavetteProfessor, Physics, GPM, CNRS, Univ Rouen, Franceبريد إلكتروني تم التحقق منه على univ-rouen.fr
