| Adsorption of cobalt (II) octaethylporphyrin and 2H-octaethylporphyrin on Ag (111): new insight into the surface coordinative bond Y Bai, F Buchner, I Kellner, M Schmid, F Vollnhals, HP Steinrück, ... New Journal of Physics 11 (12), 125004, 2009 | 105 | 2009 |
| Correlative microscopy combining secondary ion mass spectrometry and electron microscopy: comparison of intensity–hue–saturation and Laplacian pyramid methods for image fusion F Vollnhals, JN Audinot, T Wirtz, M Mercier-Bonin, I Fourquaux, ... Analytical chemistry 89 (20), 10702-10710, 2017 | 96 | 2017 |
| Electrons as “Invisible Ink”: Fabrication of Nanostructures by Local Electron Beam Induced Activation of SiOx MM Walz, M Schirmer, F Vollnhals, T Lukasczyk, HP Steinrück, ... Angewandte Chemie International Edition 49 (27), 4669-4673, 2010 | 92 | 2010 |
| Quantitative assessment of visual microscopy as a tool for microplastic research: Recommendations for improving methods and reporting S Kotar, R McNeish, C Murphy-Hagan, V Renick, CFT Lee, C Steele, ... Chemosphere 308, 136449, 2022 | 68 | 2022 |
| Roadmap for focused ion beam technologies K Höflich, G Hobler, FI Allen, T Wirtz, G Rius, L McElwee-White, ... Applied Physics Reviews 10 (4), 2023 | 46 | 2023 |
| Synthetic image rendering solves annotation problem in deep learning nanoparticle segmentation L Mill, D Wolff, N Gerrits, P Philipp, L Kling, F Vollnhals, A Ignatenko, ... Small Methods 5 (7), 2100223, 2021 | 40 | 2021 |
| Electron-beam induced deposition and autocatalytic decomposition of Co (CO) 3NO F Vollnhals, M Drost, F Tu, E Carrasco, A Späth, RH Fink, HP Steinrück, ... Beilstein journal of nanotechnology 5 (1), 1175-1185, 2014 | 37 | 2014 |
| Generation of clean iron nanocrystals on an ultra-thin SiO x film on Si (001) MM Walz, F Vollnhals, M Schirmer, HP Steinrück, H Marbach Physical Chemistry Chemical Physics 13 (38), 17333-17338, 2011 | 30 | 2011 |
| What determines accuracy of chemical identification when using microspectroscopy for the analysis of microplastics? H De Frond, W Cowger, V Renick, S Brander, S Primpke, S Sukumaran, ... Chemosphere 313, 137300, 2023 | 29 | 2023 |
| Electron beam-induced writing of nanoscale iron wires on a functional metal oxide F Vollnhals, T Woolcot, MM Walz, S Seiler, HP Steinrück, G Thornton, ... The Journal of Physical Chemistry C 117 (34), 17674-17679, 2013 | 29 | 2013 |
| Magnetotransport properties of iron microwires fabricated by focused electron beam induced autocatalytic growth F Porrati, R Sachser, MM Walz, F Vollnhals, HP Steinrück, H Marbach, ... Journal of Physics D: Applied Physics 44 (42), 425001, 2011 | 29 | 2011 |
| Investigation of proximity effects in electron microscopy and lithography MM Walz, F Vollnhals, F Rietzler, M Schirmer, HP Steinrück, H Marbach Applied Physics Letters 100 (5), 2012 | 28 | 2012 |
| Electron-beam-induced deposition and post-treatment processes to locally generate cleantitanium oxide nanostructures on Si (100) M Schirmer, MM Walz, F Vollnhals, T Lukasczyk, A Sandmann, C Chen, ... Nanotechnology 22 (8), 085301, 2011 | 27 | 2011 |
| Electron beam induced surface activation of ultrathin porphyrin layers on Ag (111) F Vollnhals, P Wintrich, MM Walz, HP Steinrück, H Marbach Langmuir 29 (39), 12290-12297, 2013 | 23 | 2013 |
| Defects in oxygen-depleted titanate nanostructures A Vittadini, M Schirmer, MM Walz, F Vollnhals, T Lukasczyk, ... Langmuir 28 (20), 7851-7858, 2012 | 20 | 2012 |
| Correlative Microscopy in 3D: Helium Ion Microscopy-Based Photogrammetric Topography Reconstruction Combined with in situ Secondary Ion Mass Spectrometry F Vollnhals, T Wirtz Analytical Chemistry 90 (20), 11989-11995, 2018 | 18 | 2018 |
| The influence of complex matrices on method performance in extracting and monitoring for microplastics LMT Hampton, H De Frond, K Gesulga, S Kotar, W Lao, C Matuch, ... Chemosphere 334, 138875, 2023 | 16 | 2023 |
| Thin membranes versus bulk substrates: investigation of proximity effects in focused electron beam-induced processing MM Walz, F Vollnhals, F Rietzler, M Schirmer, A Kunzmann, HP Steinrück, ... Journal of Physics D: Applied Physics 45 (22), 225306, 2012 | 16 | 2012 |
| X‐ray microscopy and automatic detection of defects in through silicon vias in three‐dimensional integrated circuits BC Wolz, C Jaremenko, F Vollnhals, L Kling, J Wrege, S Christiansen Engineering Reports 4 (12), e12520, 2022 | 15 | 2022 |
| On the magnetic properties of iron nanostructures fabricated via focused electron beam induced deposition and autocatalytic growth processes F Tu, M Drost, F Vollnhals, A Späth, E Carrasco, RH Fink, H Marbach Nanotechnology 27 (35), 355302, 2016 | 15 | 2016 |
