Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications JA Woollam, BD Johs, CM Herzinger, JN Hilfiker, RA Synowicki, ...
Optical Metrology: A Critical Review 10294, 3-28, 1999
474 1999 Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry JN Hilfiker, N Singh, T Tiwald, D Convey, SM Smith, JH Baker, ...
Thin Solid Films 516 (22), 7979-7989, 2008
390 2008 Spectroscopic ellipsometry: practical application to thin film characterization HG Tompkins, JN Hilfiker
Momentum Press, 2015
304 2015 Overview of variable-angle spectroscopic ellipsometry (VASE): II. Advanced applications B Johs, JA Woollam, CM Herzinger, JN Hilfiker, RA Synowicki, CL Bungay
Optical metrology: a critical review 10294, 58-87, 1999
276 1999 Optical properties of bulk and thin-film S Zollner, AA Demkov, R Liu, PL Fejes, RB Gregory, P Alluri, JA Curless, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000
159 2000 Deposition factors and band gap of zinc-blende AlN MP Thompson, GW Auner, TS Zheleva, KA Jones, SJ Simko, JN Hilfiker
Journal of Applied Physics 89 (6), 3331-3336, 2001
148 2001 Natural optical activity as the origin of the large chiroptical properties in π-conjugated polymer thin films J Wade, JN Hilfiker, JR Brandt, L Liirò-Peluso, L Wan, X Shi, F Salerno, ...
Nature communications 11 (1), 6137, 2020
121 2020 Dielectric functions of bulk 4H and 6H SiC and spectroscopic ellipsometry studies of thin SiC films on Si S Zollner, JG Chen, E Duda, T Wetteroth, SR Wilson, JN Hilfiker
Journal of applied physics 85 (12), 8353-8361, 1999
117 1999 Coplanar transmission lines on thin substrates for high-speed low-loss propagation MY Frankel, RH Voelker, JN Hilfiker
IEEE transactions on microwave theory and techniques 42 (3), 396-402, 1994
80 1994 Fundamental studies on large area Cu (In, Ga) Se2 films for high efficiency solar cells AM Hermann, C Gonzalez, PA Ramakrishnan, D Balzar, N Popa, P Rice, ...
Solar Energy Materials and Solar Cells 70 (3), 345-361, 2001
73 2001 Dielectric function modeling JN Hilfiker, T Tiwald
Spectroscopic Ellipsometry for Photovoltaics: Volume 1: Fundamental …, 2019
60 2019 Process study for laser-induced surface coloration HY Zheng, GC Lim, XC Wang, JL Tan, J Hilfiker
Journal of laser applications 14 (4), 215-220, 2002
56 2002 Calibration of a multi-pass photoacoustic spectrometer cell using light-absorbing aerosols N Bluvshtein, JM Flores, Q He, E Segre, L Segev, N Hong, A Donohue, ...
Atmospheric Measurement Techniques 10 (3), 1203-1213, 2017
50 2017 Optical and magneto-optical constants of KW Wierman, JN Hilfiker, RF Sabiryanov, SS Jaswal, RD Kirby, ...
Physical Review B 55 (5), 3093, 1997
50 1997 Optical anisotropy and charge-transfer transition energies in BiFeO SG Choi, HT Yi, SW Cheong, JN Hilfiker, R France, AG Norman
Physical Review B—Condensed Matter and Materials Physics 83 (10), 100101, 2011
49 2011 Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry JN Hilfiker, M Stadermann, J Sun, T Tiwald, JS Hale, PE Miller, ...
Applied Surface Science 421, 508-512, 2017
46 2017 Mueller matrix spectroscopic ellipsometry JN Hilfiker, N Hong, S Schoeche
Advanced Optical Technologies 11 (3-4), 59-91, 2022
44 2022 Microstructural and infrared optical properties of electrochemically etched highly doped 4H–SiC S Zangooie, POA Persson, JN Hilfiker, L Hultman, H Arwin
Journal of Applied Physics 87 (12), 8497-8503, 2000
43 2000 Mueller matrix characterization of flexible plastic substrates N Hong, RA Synowicki, JN Hilfiker
Applied Surface Science 421, 518-528, 2017
40 2017 Ellipsometry, variable angle spectroscopic JA Woollam, JN Hilfiker, RA Synowicki
Wiley Encyclopedia of Electrical and Electronics Engineering, 1-10, 1999
40 1999